Mariane Comte

According to our database, Mariane Comte authored at least 47 papers between 2002 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

On the Use of the Indirect Test Strategy for Lifetime Performance Monitoring of RF Circuits.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

J. Electron. Test., April, 2023

2021

Evaluation of a Two-Tier Adaptive Indirect Test Flow for a Front-End RF Circuit.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

J. Electron. Test., 2021

Exploring on-line RF performance monitoring based on the indirect test strategy.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, François Lefèvre

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

2020

Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

J. Electron. Test., 2020

Implementing indirect test of RF circuits without compromising test quality: a practical case study.

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzèrho, Francois Lefevre, I. Gorenflot

Proceedings of the IEEE Latin-American Test Symposium, 2020

Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs.

Florence Azaïs, Serge Bernard, Mariane Comte, Bastien Deveautour, Sophie Dupuis, Hassan El Badawi, Marie-Lise Flottes, Patrick Girard, Vincent Kerzèrho, Laurent Latorre, François Lefèvre, Bruno Rouzeyre, Emanuele Valea, T. Vayssade, Arnaud Virazel

Proceedings of the 26th IEEE International Symposium on On-Line Testing and Robust System Design, 2020

2019

Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies.

Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell

J. Electron. Test., 2019

Which metrics to use for RF indirect test strategy?

Hassan El Badawi, Mariane Comte, Florence Azaïs, Vincent Kerzèrho, Serge Bernard, François Lefevre

Proceedings of the 16th International Conference on Synthesis, 2019

Use of ensemble methods for indirect test of RF circuits: can it bring benefits?

Hassan El Badawi, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Francois Lefevre

Proceedings of the IEEE Latin American Test Symposium, 2019

2018

Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies.

Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

2017

Resistive Bridging Defect Detection in Bulk, FDSOI and FinFET Technologies.

Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell

J. Electron. Test., 2017

Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology.

Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh

Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017

Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions.

Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell, Keshav Singh

Proceedings of the 22nd IEEE European Test Symposium, 2017

2016

Guest Editorial Special Issue on Nanoelectronic Circuit and System Design Methods for the Mobile Computing Era.

Aida Todri-Sanial, Saraju P. Mohanty, Mariane Comte, Marc Belleville

ACM J. Emerg. Technol. Comput. Syst., 2016

Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect.

Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell

Proceedings of the 17th Latin-American Test Symposium, 2016

Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI - LVT and RVT Configurations.

Amit Karel, Mariane Comte, Jean-Marc Gallière, Florence Azaïs, Michel Renovell

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2016

2015

Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies.

Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell

Microelectron. J., 2015

A Framework for Efficient Implementation of Analog/RF Alternate Test with Model Redundancy.

Syhem Larguech, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

Toward Adaptation of ADCs to Operating Conditions through On-chip Correction.

Vincent Kerzerho, Ludovic Guillaume-Sage, Florence Azaïs, Mariane Comte, Michel Renovell, Serge Bernard

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

2014

Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell

Microelectron. J., 2014

Testing for gate oxide short defects using the detectability interval paradigm.

Jean-Marc Gallière, Florence Azaïs, Mariane Comte, Michel Renovell

it Inf. Technol., 2014

Evaluation of indirect measurement selection strategies in the context of analog/RF alternate testing.

Syhem Larguech, Florence Azaïs, Serge Bernard, Vincent Kerzerho, Mariane Comte, Michel Renovell

Proceedings of the 15th Latin American Test Workshop, 2014

Solutions for the self-adaptation of communicating systems in operation.

Martin Andraud, Anthony Deluthault, Mouhamadou Dieng, Florence Azaïs, Serge Bernard, Philippe Cauvet, Mariane Comte, Thibault Kervaon, Vincent Kerzerho, Salvador Mir, Paul-Henri Pugliesi-Conti, Michel Renovell, Fabien Soulier, Emmanuel Simeu, Haralampos-G. D. Stratigopoulos

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

New implementions of predictive alternate analog/RF test with augmented model redundancy.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC.

Vincent Kerzerho, Serge Bernard, Florence Azaïs, Mariane Comte, Olivier Potin, Chuan Shan, G. Bontorin, Michel Renovell

Microelectron. J., 2013

Accurate and efficient analytical electrical model of antenna for NFC applications.

Mouhamadou Dieng, Mariane Comte, Serge Bernard, Vincent Kerzerho, Florence Azaïs, Michel Renovell, Thibault Kervaon, Paul-Henri Pugliesi-Conti

Proceedings of the IEEE 11th International New Circuits and Systems Conference, 2013

Pre-characterization procedure for a mixed mode simulation of IR-drop induced delays.

Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Jie Jiang, Ilia Polian, Bernd Becker

Proceedings of the 14th Latin American Test Workshop, 2013

Implementing model redundancy in predictive alternate test to improve test confidence.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell

Proceedings of the 18th IEEE European Test Symposium, 2013

MIRID: Mixed-Mode IR-Drop Induced Delay Simulator.

Jie Jiang, Marina Aparicio, Mariane Comte, Florence Azaïs, Michel Renovell, Ilia Polian

Proceedings of the 22nd Asian Test Symposium, 2013

2012

Smart selection of indirect parameters for DC-based alternate RF IC testing.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Michel Renovell, Vincent Kerzerho, Olivier Potin, Christophe Kelma

Proceedings of the 30th IEEE VLSI Test Symposium, 2012

Making predictive analog/RF alternate test strategy independent of training set size.

Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Olivier Potin, Michel Renovell

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Digital Test Method for Embedded Converters with Unknown-Phase Harmonics.

Vincent Kerzerho, Mariane Comte, Florence Azaïs, Philippe Cauvet, Serge Bernard, Michel Renovell

J. Electron. Test., 2011

2009

An Electrical Model for the Fault Simulation of Small Delay Faults Caused by Crosstalk Aggravated Resistive Short Defects.

Nicolas Houarche, Mariane Comte, Michel Renovell, Alejandro Czutro, Piet Engelke, Ilia Polian, Bernd Becker

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

A multi-converter DFT technique for complex SIP: Concepts and validation.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

Proceedings of the 19th European Conference on Circuit Theory and Design, 2009

2008

ADC Production Test Technique Using Low-Resolution Arbitrary Waveform Generator.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Michel Renovell, Mariane Comte, Omar Chakib

VLSI Design, 2008

A Simulator of Small-Delay Faults Caused by Resistive-Open Defects.

Alejandro Czutro, Nicolas Houarche, Piet Engelke, Ilia Polian, Mariane Comte, Michel Renovell, Bernd Becker

Proceedings of the 13th European Test Symposium, 2008

2007

Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

IET Comput. Digit. Tech., 2007

"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

Proceedings of the 12th European Test Symposium, 2007

2006

A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs.

Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell

IEEE Des. Test Comput., 2006

Electrical Behavior of GOS Fault affected Domino Logic Cell.

Mariane Comte, Satoshi Ohtake, Hideo Fujiwara, Michel Renovell

Proceedings of the Third IEEE International Workshop on Electronic Design, 2006

A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency.

Michel Renovell, Mariane Comte, Ilia Polian, Piet Engelke, Bernd Becker

Proceedings of the 15th Asian Test Symposium, 2006

2005

Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications.

Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell

J. Electron. Test., 2005

2004

Efficiency of Spectral-Based ADC Test Flows to Detect Static Errors.

Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell

J. Electron. Test., 2004

Correlation Between Static and Dynamic Parameters of A-to-D Converters: In the View of a Unique Test Procedure.

Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell

J. Electron. Test., 2004

2003

A-to-D converters static error detection from dynamic parameter measurement.

Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell

Microelectron. J., 2003

A New Methodology For ADC Test Flow Optimization.

Serge Bernard, Mariane Comte, Florence Azaïs, Yves Bertrand, Michel Renovell

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Estimating Static Parameters of A-to-D Converters from Spectral Analysis.

Florence Azaïs, Serge Bernard, Yves Bertrand, Mariane Comte, Michel Renovell, Marcelo Lubaszewski

Proceedings of the 3rd Latin American Test Workshop, 2002