Amr M. S. Tosson

Orcid: 0000-0002-4258-9971

According to our database1, Amr M. S. Tosson authored at least 10 papers between 2013 and 2022.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2022
A Novel 2T2R CR-based TCAM Design for High-speed and Energy-efficient Applications.
Proceedings of the GLSVLSI '22: Great Lakes Symposium on VLSI 2022, Irvine CA USA, June 6, 2022

2021
Error Resilience and Recovery of Process Induced Stuck-at Faults in MLP Neural Networks using Emerging Technology.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2021

A Novel Programmable Variation-Tolerant RRAM-based Delay Element Circuit.
Proceedings of the IEEE/ACM International Symposium on Nanoscale Architectures, 2021

2017
A Study of the Effect of RRAM Reliability Soft Errors on the Performance of RRAM-Based Neuromorphic Systems.
IEEE Trans. Very Large Scale Integr. Syst., 2017

Analysis of RRAM Reliability Soft-Errors on the Performance of RRAM-Based Neuromorphic Systems.
Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017

Mitigating the Effect of Reliability Soft-errors of RRAM Devices on the Performance of RRAM-based Neuromorphic Systems.
Proceedings of the on Great Lakes Symposium on VLSI 2017, 2017

1T2R: A novel memory cell design to resolve single-event upset in RRAM arrays.
Proceedings of the 12th IEEE International Conference on ASIC, 2017

2016
RRAM Refresh Circuit: A Proposed Solution To Resolve The Soft-Error Failures For HfO<sub>2</sub>/Hf 1T1R RRAM Memory Cell.
Proceedings of the 26th edition on Great Lakes Symposium on VLSI, 2016

8T1R: A Novel Low-power High-speed RRAM-based Non-volatile SRAM Design.
Proceedings of the 26th edition on Great Lakes Symposium on VLSI, 2016

2013
Tagged probabilistic simulation based error probability estimation for better-than-worst case circuit design.
Proceedings of the 21st IEEE/IFIP International Conference on VLSI and System-on-Chip, 2013


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