Atul Maheshwari

According to our database, Atul Maheshwari authored at least 10 papers between 2002 and 2010.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of two.

2010

HVM performance validation and DFM techniques used in a 32nm CMOS thermal sensor system.

David E. Duarte, Paola Zepeda, Suching Hsu, Atul Maheshwari, Greg Taylor

Proceedings of the IEEE Custom Integrated Circuits Conference, 2010

2007

Current-Sensing and Repeater Hybrid Circuit Technique for On-Chip Interconnects.

Atul Maheshwari, Wayne P. Burleson

IEEE Trans. Very Large Scale Integr. Syst., 2007

2005

An energy-aware active smart card.

Russell Tessier, David Jasinski, Atul Maheshwari, Aiyappan Natarajan, Weifeng Xu, Wayne P. Burleson

IEEE Trans. Very Large Scale Integr. Syst., 2005

Sensing Design Issues in Deep Submicron CMOS SRAMs.

Aiyappan Natarajan, Vijay Shankar, Atul Maheshwari, Wayne P. Burleson

Proceedings of the 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), 2005

2004

Trading off transient fault tolerance and power consumption in deep submicron (DSM) VLSI circuits.

Atul Maheshwari, Wayne P. Burleson, Russell Tessier

IEEE Trans. Very Large Scale Integr. Syst., 2004

Differential current-sensing for on-chip interconnects.

Atul Maheshwari, Wayne P. Burleson

IEEE Trans. Very Large Scale Integr. Syst., 2004

Mitigating static power in current-sensed interconnects.

Vishak Venkatraman, Atul Maheshwari, Wayne P. Burleson

Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, 2004

2003

Repeater and current-sensing hybrid circuits for on-chip interconnects.

Atul Maheshwari, Wayne P. Burleson

Proceedings of the 13th ACM Great Lakes Symposium on VLSI 2003, 2003

Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits.

Atul Maheshwari, Israel Koren, Wayne P. Burleson

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

2002

Trading off Reliability and Power-Consumption in Ultra-low Power Systems.

Atul Maheshwari, Wayne P. Burleson, Russell Tessier

Proceedings of the 3rd International Symposium on Quality of Electronic Design, 2002