Aubin Roy

According to our database, Aubin Roy authored at least 12 papers between 1999 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Contactless Test of IC Pads, Pins, and TSVs via Standard Boundary Scan.

Stephen K. Sunter, Aubin Roy

IEEE Des. Test Comput., 2012

2011

Adaptive parametric BIST of high-speed parallel I/Os via standard boundary scan.

Stephen K. Sunter, Aubin Roy

Proceedings of the 2011 IEEE International Test Conference, 2011

A Mixed-Signal Test Bus and Analog BIST with 'Unlimited' Time and Voltage Resolution.

Stephen K. Sunter, Aubin Roy

Proceedings of the 16th European Test Symposium, 2011

2008

Noise-Insensitive Digital BIST for any PLL or DLL.

Stephen K. Sunter, Aubin Roy

J. Electron. Test., 2008

2007

A selt-testing BOST for high-frequency PLLs, DLLs, and SerDes.

Stephen K. Sunter, Aubin Roy

Proceedings of the 2007 IEEE International Test Conference, 2007

Purely Digital BIST for Any PLL or DLL.

Stephen K. Sunter, Aubin Roy

Proceedings of the 12th European Test Symposium, 2007

Testing SerDes beyond 4 Gbps - changing priorities.

Stephen K. Sunter, Aubin Roy

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2006

Structural Tests for Jitter Tolerance in SerDes Receivers.

Stephen K. Sunter, Aubin Roy

Proceedings of the 2006 IEEE International Test Conference, 2006

2004

On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz.

Stephen K. Sunter, Aubin Roy

IEEE Des. Test Comput., 2004

An Automated, Complete, Structural Test Solution for SERDES.

Stephen K. Sunter, Aubin Roy, Jean-Francois Cote

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2002

High Accuracy Stimulus Generation for A/D Converter BIST.

Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

1999

BIST for phase-locked loops in digital applications.

Stephen K. Sunter, Aubin Roy

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999