Alessandra Fudoli

According to our database, Alessandra Fudoli authored at least 7 papers between 2002 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2004

A BIST-based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.

Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Paolo Bernardi, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda

J. Electron. Test., 2004

Understanding Yield Losses in Logic Circuits.

Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew

IEEE Des. Test Comput., 2004

Yield Analysis of Logic Circuits.

Davide Appello, Alessandra Fudoli, Katia Giarda, Emil Gizdarski, Ben Mathew, Vincenzo Tancorre

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

2003

Exploiting Programmable BIST For The Diagnosis of Embedded Memory Cores.

Davide Appello, Paolo Bernardi, Alessandra Fudoli, Maurizio Rebaudengo, Matteo Sonza Reorda, Vincenzo Tancorre, Massimo Violante

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

A practical evaluation of I_DDQ test strategies for deep submicron production test application. Experiences and targets from the field.

Alessandra Fudoli, Alberto Ascagni, Davide Appello, Hans A. R. Manhaeve

Proceedings of the 8th European Test Workshop, 2003

2002

A BIST-Based Solution for the Diagnosis of Embedded Memories Adopting Image Processing Techniques.

Davide Appello, Alessandra Fudoli, Vincenzo Tancorre, Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Reorda

Proceedings of the 10th IEEE International Workshop on Memory Technology, 2002

High Accuracy Stimulus Generation for A/D Converter BIST.

Aubin Roy, Stephen K. Sunter, Alessandra Fudoli, Davide Appello

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002