Bappaditya Mondal

According to our database, Bappaditya Mondal authored at least 12 papers between 2014 and 2026.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2026

Temporal Analysis Based Exploratory Data Analysis for Phishing Email Detection via Machine Learning.

Tanmoy Chanda, Biva Mondal, Subhashis Das, Soumendu Banerjee, Bappaditya Mondal

Proceedings of the Distributed Computing and Intelligent Technology, 2026

2022

An Online Testing Technique for the Detection of Control Nodes Displacement Faults (CNDF) in Reversible Circuits.

Bappaditya Mondal, Udit Narayana Kar, Chandan Bandyopadhyay, Debashri Roy, Hafizur Rahaman

Proceedings of the VLSI Design and Test - 26th International Symposium, 2022

2021

An improved heuristic technique for nearest neighbor realization of quantum circuits in 2D architecture.

Anirban Bhattacharjee, Chandan Bandyopadhyay, Philipp Niemann, Bappaditya Mondal, Rolf Drechsler, Hafizur Rahaman

Integr., 2021

Fault-tolerant quantum implementation of conventional decoder logic with enable input.

Laxmidhar Biswal, Bappaditya Mondal, Hafizur Rahaman

IET Circuits Devices Syst., 2021

2020

Linear Nearest Neighbor Realization of Quantum Circuits Using Clustering and Look-ahead Policy.

Anirban Bhattacharjee, Chandan Bandyopadhyay, Bappaditya Mondal, Hafizur Rahaman

J. Circuits Syst. Comput., 2020

2019

Boolean Difference Technique for Detecting All Missing Gate and Stuck-at Faults in Reversible Circuits.

Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh Kumar Das

J. Circuits Syst. Comput., 2019

An Approach for Detection of Node Displacement Fault (NDF) in Reversible Circuit.

Bappaditya Mondal, Anirban Bhattacharjee, Subham Saha, Shalini Parekh, Chandan Bandyopadhyay, Hafizur Rahaman

Proceedings of the VLSI Design and Test - 23rd International Symposium, 2019

2017

Detection and localization of appearance faults in reversible circuits.

Bappaditya Mondal, Chandan Bandyopadhyay, Hafizur Rahaman

Proceedings of the 7th International Symposium on Embedded Computing and System Design, 2017

2016

A testing scheme for mixed-control based reversible circuits.

Bappaditya Mondal, Chandan Bandyopadhyay, Hafizur Rahaman

Proceedings of the Sixth International Symposium on Embedded Computing and System Design, 2016

2015

Boolean Difference Technique for Detecting All Missing Gate Faults in Reversible Circuits.

Joyati Mondal, Bappaditya Mondal, Dipak Kumar Kole, Hafizur Rahaman, Debesh K. Das

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

Diagnosis of SMGF in ESOP Based Reversible Logic Circuit.

Bappaditya Mondal, Chandan Bandyopadhyay, Dipak Kumar Kole, Jimson Mathew, Hafizur Rahaman

Proceedings of the 2014 Fifth International Symposium on Electronic System Design, 2014

Generator for Test Set Construction of SMGF in Reversible Circuit by Boolean Difference Method.

Bappaditya Mondal, Dipak Kumar Kole, Debesh Kumar Das, Hafizur Rahaman

Proceedings of the 23rd IEEE Asian Test Symposium, 2014