Boxue Yin

According to our database, Boxue Yin authored at least 11 papers between 2009 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2022

OceanBase: A 707 Million tpmC Distributed Relational Database System.

Zhenkun Yang, Chuanhui Yang, Fusheng Han, Mingqiang Zhuang, Bing Yang, Zhifeng Yang, Xiaojun Cheng, Yuzhong Zhao, Wenhui Shi, Huafeng Xi, Huang Yu, Bin Liu, Yi Pan, Boxue Yin, Junquan Chen, Quanqing Xu

Proc. VLDB Endow., 2022

2016

Leveraging Page-Level Compression in MySQL - A Practice at Baidu.

Jingwei Ma, Boxue Yin, Zhi Kong, Yuxiang Ma, Chang Chen, Long Wang, Gang Wang, Xiaoguang Liu

Proceedings of the 2016 IEEE Trustcom/BigDataSE/ISPA, 2016

Read Consistency in Distributed Database Based on DMVCC.

Jie Shao, Boxue Yin, Bujiao Chen, Guangshu Wang, Lin Yang, Jianliang Yan, Jianying Wang, Weidong Liu

Proceedings of the 23rd IEEE International Conference on High Performance Computing, 2016

2014

Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing.

Dong Xiang, Wenjie Sui, Boxue Yin, Kwang-Ting Cheng

IEEE Trans. Very Large Scale Integr. Syst., 2014

2010

Scan chain configuration based X-filling for low power and high quality testing.

Zhen Chen, J. Feng, Dong Xiang, Boxue Yin

IET Comput. Digit. Tech., 2010

2009

Dynamic Test Compaction for Transition Faults in Broadside Scan Testing Based on an Influence Cone Measure.

Dong Xiang, Boxue Yin, Kwang-Ting Cheng

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

The ATPG Conflict-Driven Scheme for High Transition Fault Coverage and Low Test Cost.

Zhen Chen, Dong Xiang, Boxue Yin

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

New Techniques for Accelerating Small Delay ATPG and Generating Compact Test Sets.

Boxue Yin, Dong Xiang, Zhen Chen

Proceedings of the VLSI Design 2009: Improving Productivity through Higher Abstraction, 2009

A power-effective scan architecture using scan flip-flops clustering and post-generation filling.

Zhen Chen, Dong Xiang, Boxue Yin

Proceedings of the 19th ACM Great Lakes Symposium on VLSI 2009, 2009

Compact Test Generation for Small-Delay Defects Using Testable-Path Information.

Dong Xiang, Boxue Yin, Krishnendu Chakrabarty

Proceedings of the Eighteentgh Asian Test Symposium, 2009

Conflict driven scan chain configuration for high transition fault coverage and low test power.

Zhen Chen, Boxue Yin, Dong Xiang

Proceedings of the 14th Asia South Pacific Design Automation Conference, 2009