Cédric Leyris

According to our database, Cédric Leyris authored at least 3 papers between 2007 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

0.13µm SiGe BiCMOS Technology Fully Dedicated to mm-Wave Applications.

Grégory Avenier, Malick Diop, Pascal Chevalier, Germaine Troillard, Nicolas Loubet, Julien Bouvier, Linda Depoyan, Nicolas Derrier, Michel Buczko, Cédric Leyris, Samuel Boret, Sébastien Montusclat, Alain Margain, Sébastien Pruvost, Sean T. Nicolson, Kenneth H. K. Yau, Nathalie Revil, Daniel Gloria, Didier Dutartre, Sorin P. Voinigescu, Alain Chantre

IEEE J. Solid State Circuits, 2009

2007

Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization.

Cédric Leyris, Frédéric Martinez, M. Valenza, Alain Hoffmann, J. C. Vildeuil

Microelectron. Reliab., 2007

N-MOSFET oxide trap characterization induced by nitridation process using RTS noise analysis.

Cédric Leyris, Frédéric Martinez, Alain Hoffmann, M. Valenza, J. C. Vildeuil

Microelectron. Reliab., 2007