Didier Dutartre

According to our database, Didier Dutartre authored at least 4 papers between 2005 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Improving Ge-rich GST ePCM reliability through BEOL engineering.

Andrea Redaelli, Anna Gandolfo, Giulia Samanni, Enrico Gomiero, Elisa Petroni, Luca Scotti, Andrea Lippiello, Paolo Mattavelli, J. Jasse, D. Codegoni, A. Serafini, Rossella Ranica, Christian Boccaccio, Jury Sandrini, R. Berthelon, J. C. Grenier, Olivier Weber, David Turgis, A. Valery, S. Del Medico, V. Caubet, J. P. Reynard, Didier Dutartre, L. Favennec, Antonino Conte, Fabio Disegni, M. De Tomasi, A. Ventre, Matteo Baldo, Daniele Ielmini, Alfonso Maurelli, P. Ferreira, Franck Arnaud, F. Piazza, Paolo Cappelletti, Roberto Annunziata, R. Gonella

Proceedings of the 51st IEEE European Solid-State Device Research Conference, 2021

2016

Performance and layout effects of SiGe channel in 14nm UTBB FDSOI: SiGe-first vs. SiGe-last integration.

R. Berthelon, François Andrieu, P. Perreau, E. Baylac, A. Pofelski, Emmanuel Josse, Didier Dutartre, A. Claverie, Michel Haond

Proceedings of the 46th European Solid-State Device Research Conference, 2016

2009

0.13µm SiGe BiCMOS Technology Fully Dedicated to mm-Wave Applications.

Grégory Avenier, Malick Diop, Pascal Chevalier, Germaine Troillard, Nicolas Loubet, Julien Bouvier, Linda Depoyan, Nicolas Derrier, Michel Buczko, Cédric Leyris, Samuel Boret, Sébastien Montusclat, Alain Margain, Sébastien Pruvost, Sean T. Nicolson, Kenneth H. K. Yau, Nathalie Revil, Daniel Gloria, Didier Dutartre, Sorin P. Voinigescu, Alain Chantre

IEEE J. Solid State Circuits, 2009

2005

230-GHz self-aligned SiGeC HBT for optical and millimeter-wave applications.

Pascal Chevalier, Cyril Fellous, Laurent Rubaldo, Franck Pourchon, Sébastien Pruvost, Rudy Beerkens, Fabienne Saguin, Nicolas Zerounian, Benoît Barbalat, Sylvie Lépilliet, Didier Dutartre, Didier Céli, Isabelle Telliez, Daniel Gloria, Frédéric Aniel, François Danneville, Alain Chantre

IEEE J. Solid State Circuits, 2005