Chenglin Yang

According to our database1, Chenglin Yang authored at least 17 papers between 2009 and 2019.

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Bibliography

2019
Fault Diagnosis of Analog Filter Circuit Based on Genetic Algorithm.
IEEE Access, 2019

2018
Parallel-Series Multiobjective Genetic Algorithm for Optimal Tests Selection With Multiple Constraints.
IEEE Trans. Instrumentation and Measurement, 2018

2017
Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data.
Sensors, 2017

Methods of sequential test optimization in dynamic environment.
Microelectronics Reliability, 2017

Grouped Genetic Algorithm Based Optimal Tests Selection for System with Multiple Operation Modes.
J. Electronic Testing, 2017

2016
A Novel Method of Failure Sample Selection for Electrical Systems Using Ant Colony Optimization.
Comp. Int. and Neurosc., 2016

Fault Diagnosis for Analog Circuits by Using EEMD, Relative Entropy, and ELM.
Comp. Int. and Neurosc., 2016

2014
Complex Field Fault Modeling-Based Optimal Frequency Selection in Linear Analog Circuit Fault Diagnosis.
IEEE Trans. Instrumentation and Measurement, 2014

Circle Equation-Based Fault Modeling Method for Linear Analog Circuits.
IEEE Trans. Instrumentation and Measurement, 2014

A novel test optimizing algorithm for sequential fault diagnosis.
Microelectronics Journal, 2014

Test Generation Algorithm for Fault Detection of Analog Circuits Based on Extreme Learning Machine.
Comp. Int. and Neurosc., 2014

A Novel Prediction Method for Analog Circuits Based on Gaussian White Noise Estimation.
Proceedings of the 17th IEEE International Conference on Computational Science and Engineering, 2014

2013
Fault Modeling on Complex Plane and Tolerance Handling Methods for Analog Circuits.
IEEE Trans. Instrumentation and Measurement, 2013

2011
Methods of Handling the Tolerance and Test-Point Selection Problem for Analog-Circuit Fault Diagnosis.
IEEE Trans. Instrumentation and Measurement, 2011

2010
A Novel Test Point Selection Method for Analog Fault Dictionary Techniques.
J. Electronic Testing, 2010

2009
Application of Heuristic Graph Search to Test-Point Selection for Analog Fault Dictionary Techniques.
IEEE Trans. Instrumentation and Measurement, 2009

Test Points Selection for Analog Fault Dictionary Techniques.
J. Electronic Testing, 2009


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