Chih-Cherng Liao

According to our database, Chih-Cherng Liao authored at least 8 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

A Concise Electrothermal Model to Characterize the Thermal Safe-Operating Area of Power Transistor.

Jian-Hsing Lee, Gong-Kai Lin, Chun-Chih Chen, Li-Fan Chen, Chien-Wei Wang, Shao-Chang Huang, Ching-Ho Li, Chih-Cherng Liao, Jung-Tsun Chuang, Ke-Horng Chen

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Transmission Line Pulse Width Impacting on Device Performances.

Shao-Chang Huang, Chien-Wei Wang, Chih-Hsuan Lin, Kai-Chieh Hsu, Ching-Ho Li, Chih-Cherng Liao, Jung-Tsun Chuang, Gong-Kai Lin, Lin-Fan Chen, Chun-Chih Chen, Yeh-Ning Jou, Jian-Hsing Lee, Ke-Horng Chen

Proceedings of the International Conference on Consumer Electronics - Taiwan, 2023

Optimizing Device Metal Routing Layouts by the Simulation Tool.

Shao-Chang Huang, Ching-Ho Li, Chih-Cherng Liao, Jung-Tsun Chuang, Chien-Wei Wang, Gong-Kai Lin, Lin-Fan Chen, Chun-Chih Chen, Kuan-I Ho, Che-Hua Chang, Hsiao-Ying Yang, Chung-Ren Lao, Jian-Hsing Lee, Ke-Horng Chen

Proceedings of the International Conference on Consumer Electronics - Taiwan, 2023

Bipolar Transistors' Holding Phenomena.

Shao-Chang Huang, Kai-Chieh Hsu, Chih-Hsuan Lin, Chien-Wei Wang, Ching-Ho Li, Chih-Cherng Liao, Jung-Tsun Chuang, Gong-Kai Lin, Lin-Fan Chen, Chun-Chih Chen, Yeh-Ning Jou, Jian-Hsing Lee, Ke-Horng Chen

Proceedings of the International Conference on Consumer Electronics - Taiwan, 2023

2022

Incorporation of a Simple ESD Circuit in a 650V E-Mode GaN HEMT for All-Terminal ESD Protection.

Jian-Hsing Lee, Yeh-Jen Huang, Li-Yang Hong, Li-Fan Chen, Yeh-Ning Jou, Shin-Cheng Lin, Walter Wohlmuth, Chih-Cherng Liao, Ching-Ho Li, Shoa-Chang Huang, Ke-Horng Chen

Proceedings of the IEEE International Reliability Physics Symposium, 2022

EOS Endurance Power Circuits without Depletion Mode Devices.

Shao-Chang Huang, Jian-Hsing Lee, Ching-Ho Li, Sue-Yi Chen, Chih-Hsuan Lin, Chun-Chih Chen, Li-Fan Chen, Gong-Kai Lin, Chien-Wei Wang, Kai-Chieh Hsu, Szu-Chi Chen, Shang-Chuan Pai, Fu-Wei Pai, Yin-Wei Peng, Chih-Cherng Liao, Ke-Horng Chen

Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2022

Gate Voltages Impacting on Latch-up Measurements.

Shao-Chang Huang, Jian-Hsing Lee, Chun-Chih Chen, Ching-Ho Li, Chih-Cherng Liao, Kai-Chieh Hsu, Gong-Kai Lin, Li-Fan Chen, Chien-Wei Wang, Chih-Hsuan Lin, Yeh-Ning Jou, Ke-Horng Chen

Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2022

2019

Analyzing Gate-Driven Circuit Parameters for Adding ESD Performances.

Shao-Chang Huang, Chih-Cherng Liao, Hsien-Feng Liao, Shou-Peng Weng, Karuna Nidhi, Yu-Kai Wang, Yi-Jen Chen, Hwa-Chyi Chiou, Yeh-Ning Jou, Jian-Hsing Lee

Proceedings of the IEEE International Conference on Consumer Electronics - Taiwan, 2019