Christoph Weimer

Orcid: 0000-0002-6005-0937

According to our database¹, Christoph Weimer authored at least 7 papers between 2020 and 2023.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of five.

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Bibliography

2023

Nonlinear Compact Modeling of InP/InGaAs DHBTs with HICUM/L2.

[BibT_eX]

[DOI]

Markus Müller

Christoph Weimer

Michael Schröter

Proceedings of the 53rd IEEE European Solid-State Device Research Conference, 2023

Numerical Device Simulation Aided Study of RF-Stress-Caused Degradation in SiGe HBTs.

[BibT_eX]

[DOI]

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2023

2022

Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs.

[BibT_eX]

[DOI]

Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022

Thermal impedance of SiGe HBTs: Characterization and modeling.

[BibT_eX]

[DOI]

Proceedings of the 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2022

2021

An Experimental Load-Pull Based Large-Signal RF Reliability Study of SiGe HBTs.

[BibT_eX]

[DOI]

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021

Augmented Drift-Diffusion Transport for the Simulation of Advanced SiGe HBTs.

[BibT_eX]

[DOI]

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2021

2020

Modeling the temperature dependence of sheet and contact resistances in SiGe: C HBTs from 4.3 to 423 K.

[BibT_eX]

[DOI]

Proceedings of the IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, 2020

Christoph Weimer

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