Daniel S. Reed

According to our database, Daniel S. Reed authored at least 2 papers between 2016 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Scaling trends and bias dependence of the soft error rate of 16 nm and 7 nm FinFET SRAMs.

Balaji Narasimham, Saket Gupta, Daniel S. Reed, J. K. Wang, Nick Hendrickson, Hasan Taufique

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2016

Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories.

Saket Gupta, Carl Monzel, Daniel S. Reed, Yifei Zhang, Mark Winter, Myron Buer

IEEE Trans. Circuits Syst. I Regul. Pap., 2016