Dave Armstrong

According to our database, Dave Armstrong authored at least 3 papers between 2007 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Special Session: Test Challenges in a Chiplet Marketplace.

Marc Hutner, R. Sethuram, Bapi Vinnakota, Dave Armstrong, A. Copperhall

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

2016

Known-good-die test methods for large, thin, high-power digital devices.

Dave Armstrong, Gary Maier

Proceedings of the 2016 IEEE International Test Conference, 2016

2007

An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time.

Takahiro J. Yamaguchi, H. X. Hou, Koji Takayama, Dave Armstrong, Masahiro Ishida, Mani Soma

Proceedings of the 2007 IEEE International Test Conference, 2007