Deruo Cheng

According to our database, Deruo Cheng authored at least 10 papers between 2018 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Integrated Circuit Mask-Generative Adversarial Network for Circuit Annotation With Targeted Data Augmentation.

Yee-Yang Tee, Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee

IEEE Intell. Syst., 2024

2023

Patch-Based Adversarial Training for Error-Aware Circuit Annotation of Delayered IC Images.

Yee-Yang Tee, Xuenong Hong, Deruo Cheng, Chye-Soon Chee, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee

IEEE Trans. Circuits Syst. II Express Briefs, September, 2023

Deep-learning-based X-ray CT Slice Analysis for Layout Verification in Printed Circuit Boards.

Deruo Cheng, Yiqiong Shi, Yee-Yang Tee, Jingsi Song, Xue Wang, Bihan Wen, Bah-Hwee Gwee

Proceedings of the 5th IEEE International Conference on Artificial Intelligence Circuits and Systems, 2023

2022

Delayered IC image analysis with template-based Tanimoto Convolution and Morphological Decision.

Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, Kar-Ann Toh

IET Circuits Devices Syst., 2022

Unsupervised Domain Adaptation with Histogram-gated Image Translation for Delayered IC Image Analysis.

Yee-Yang Tee, Deruo Cheng, Chye-Soon Chee, Tong Lin, Yiqiong Shi, Bah-Hwee Gwee

CoRR, 2022

2021

Joint Anomaly Detection and Inpainting for Microscopy Images Via Deep Self-Supervised Learning.

Ling Huang, Deruo Cheng, Xulei Yang, Tong Lin, Yiqiong Shi, Kaiyi Yang, Bah-Hwee Gwee, Bihan Wen

Proceedings of the 2021 IEEE International Conference on Image Processing, 2021

2019

A Hierarchical Multiclassifier System for Automated Analysis of Delayered IC Images.

Deruo Cheng, Yiqiong Shi, Bah-Hwee Gwee, Kar-Ann Toh, Tong Lin

IEEE Intell. Syst., 2019

Global Template Projection and Matching Method for Training-Free Analysis of Delayered IC Images.

Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, Kar-Ann Toh

Proceedings of the IEEE International Symposium on Circuits and Systems, 2019

2018

Hybrid K-Means Clustering and Support Vector Machine Method for via and Metal Line Detections in Delayered IC Images.

Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee, Kar-Ann Toh

IEEE Trans. Circuits Syst. II Express Briefs, 2018

Deep Learning for Automatic IC Image Analysis.

Xuenong Hong, Deruo Cheng, Yiqiong Shi, Tong Lin, Bah-Hwee Gwee

Proceedings of the 23rd IEEE International Conference on Digital Signal Processing, 2018