Dirk Niggemeyer

According to our database, Dirk Niggemeyer authored at least 13 papers between 1998 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2004

Automatic Generation of Diagnostic Memory Tests Based on Fault Decomposition and Output Tracing.

Dirk Niggemeyer, Elizabeth M. Rudnick

IEEE Trans. Computers, 2004

2003

A data acquisition methodology for on-chip repair of embedded memories.

Dirk Niggemeyer, Elizabeth M. Rudnick

ACM Trans. Design Autom. Electr. Syst., 2003

2001

Use of a field programmable gate array for education in manufacturing test and automatic test equipment.

Dirk Niggemeyer, Kevin J. Stephano, Elizabeth M. Rudnick

IEEE Trans. Educ., 2001

Automatic Generation of Diagnostic March Tests.

Dirk Niggemeyer, Elizabeth M. Rudnick

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

2000

Using GLFSRs for Pseudo-Random Memory BIST.

Michael Redeker, Markus Rudack, Thomas Lobbe, Dirk Niggemeyer

Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000

Diagnostic Testing of Embedded Memories Based on Output Tracing.

Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Redeker

Proceedings of the 8th IEEE International Workshop on Memory Technology, 2000

Diagnostic Testing of Embedded Memories Using BIST.

Timothy J. Bergfeld, Dirk Niggemeyer, Elizabeth M. Rudnick

Proceedings of the 2000 Design, 2000

1999

Yield Enhancement Considerations for a Single-Chip Multiprocessor System with Embedded DRAM.

Markus Rudack, Dirk Niggemeyer

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

Parametric Built-In Self-Test of VLSI Systems.

Dirk Niggemeyer, M. Rüffer

Proceedings of the 1999 Design, 1999

1998

Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores.

Petra Nordholz, Dieter Treytnar, Jan Otterstedt, Hartmut Grabinski, Dirk Niggemeyer, T. W. Williams

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Detection of CMOS address decoder open faults with March and pseudo random memory tests.

Jan Otterstedt, Dirk Niggemeyer, T. W. Williams

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

Core Interconnect Testing Hazards.

Petra Nordholz, Hartmut Grabinski, Dieter Treytnar, Jan Otterstedt, Dirk Niggemeyer, Uwe Arz, T. W. Williams

Proceedings of the 1998 Design, 1998

A Video Signal Processor for MIMD Multiprocessing.

Jörg Hilgenstock, Klaus Herrmann, Jan Otterstedt, Dirk Niggemeyer, Peter Pirsch

Proceedings of the 35th Conference on Design Automation, 1998