Eddy De Backer

According to our database, Eddy De Backer authored at least 6 papers between 2001 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Next generation of Deep Trench Isolation for Smart Power technologies with 120 V high-voltage devices.

R. Charavel, Jaume Roig, S. Mouhoubi, P. Gassot, Filip Bauwens, Piet Vanmeerbeek, B. Desoete, Peter Moens, Eddy De Backer

Microelectron. Reliab., 2010

2008

MIMC reliability and electrical behavior defined by a physical layer property of the dielectric.

Jan Ackaert, R. Charavel, K. Dhondt, B. Vlachakis, Luc De Schepper, M. Millecam, E. Vandevelde, P. Bogaert, A. Iline, Eddy De Backer, Alexandru Vlad, Jean-Pierre Raskin

Microelectron. Reliab., 2008

2004

Plasma Charging Damage Reduction in IC Processing by A Self-balancing Interconnect.

Zhichun Wang, Jan Ackaert, Cora Salm, Fred G. Kuper, Eddy De Backer

Microelectron. Reliab., 2004

2003

Charging induced damage by photoconduction through thick inter metal dielectrics.

Jan Ackaert, Klara Bessemans, Eddy De Backer

Microelectron. Reliab., 2003

2001

Correlation between predicted cause of SRAM failures and in-line defect data.

Peter Coppens, Guido Vanhorebeek, Eddy De Backer

Microelectron. Reliab., 2001

Non Contact Surface Potential Measurements for Charging Reduction During Manufacturing of Metal-Insulator-Metal Capacitors.

Jan Ackaert, Zhichun Wang, Eddy De Backer, P. Colson, Peter Coppens

Microelectron. Reliab., 2001