Cora Salm

According to our database1, Cora Salm authored at least 13 papers between 2002 and 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2020
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018
Towards understanding recovery of hot-carrier induced degradation.
Microelectron. Reliab., 2018

2017
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs.
Microelectron. Reliab., 2017

2008
Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip.
Microelectron. Reliab., 2008

2007
Low-frequency noise in hot-carrier degraded nMOSFETs.
Microelectron. Reliab., 2007

Low-Frequency Noise Phenomena in Switched MOSFETs.
IEEE J. Solid State Circuits, 2007

2006
Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs.
Microelectron. Reliab., 2006

2005
A 3-D Circuit Model to evaluate CDM performance of ICs.
Microelectron. Reliab., 2005

2004
Plasma Charging Damage Reduction in IC Processing by A Self-balancing Interconnect.
Microelectron. Reliab., 2004

2003
Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy.
Microelectron. Reliab., 2003

2002
The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress.
Microelectron. Reliab., 2002

Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime.
Microelectron. Reliab., 2002

Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling.
Microelectron. Reliab., 2002


  Loading...