Cora Salm

According to our database, Cora Salm authored at least 13 papers between 2002 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices.

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Towards understanding recovery of hot-carrier induced degradation.

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz

Microelectron. Reliab., 2018

2017

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs.

Maurits J. de Jong, Cora Salm, Jurriaan Schmitz

Microelectron. Reliab., 2017

2008

Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip.

Cora Salm, Victor M. Blanco Carballo, Joost Melai, Jurriaan Schmitz

Microelectron. Reliab., 2008

2007

Low-frequency noise in hot-carrier degraded nMOSFETs.

Cora Salm, Eric Hoekstra, Jay S. Kolhatkar, André J. Hof, Hans Wallinga, Jurriaan Schmitz

Microelectron. Reliab., 2007

Low-Frequency Noise Phenomena in Switched MOSFETs.

Arnoud P. van der Wel, Eric A. M. Klumperink, Jay S. Kolhatkar, Eric Hoekstra, Martijn F. Snoeij, Cora Salm, Hans Wallinga, Bram Nauta

IEEE J. Solid State Circuits, 2007

2006

Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs.

Cora Salm, André J. Hof, Fred G. Kuper, Jurriaan Schmitz

Microelectron. Reliab., 2006

2005

A 3-D Circuit Model to evaluate CDM performance of ICs.

M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2005

2004

Plasma Charging Damage Reduction in IC Processing by A Self-balancing Interconnect.

Zhichun Wang, Jan Ackaert, Cora Salm, Fred G. Kuper, Eddy De Backer

Microelectron. Reliab., 2004

2003

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy.

M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2003

2002

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress.

M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2002

Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime.

H. V. Nguyen, Cora Salm, R. Wenzel, A. J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2002

Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling.

H. V. Nguyen, Cora Salm, J. Vroemen, J. Voets, Benno Krabbenborg, Jaap Bisschop, A. J. Mouthaan, Fred G. Kuper

Microelectron. Reliab., 2002