Elaheh Malekzadeh

According to our database, Elaheh Malekzadeh authored at least 3 papers between 2021 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2022

VEDLIoT: Very Efficient Deep Learning in IoT.

Martin Kaiser, René Griessl, Nils Kucza, Carola Haumann, Lennart Tigges, Kevin Mika, Jens Hagemeyer, Florian Porrmann, Ulrich Rückert, Micha vor dem Berge, Stefan Krupop, Mario Porrmann, Marco Tassemeier, Pedro Trancoso, Fareed Qararyah, Stavroula Zouzoula, António Casimiro, Alysson Bessani, José Cecílio, Stefan Andersson, Oliver Brunnegård, Olof Eriksson, Roland Weiss, Franz Meierhöfer, Hans Salomonsson, Elaheh Malekzadeh, Daniel Ödman, Anum Khurshid, Pascal Felber, Marcelo Pasin, Valerio Schiavoni, Jämes Ménétrey, Karol Gugula, Piotr Zierhoffer, Eric Knauss, Hans-Martin Heyn

CoRR, 2022

VEDLIoT: Very Efficient Deep Learning in IoT.

Martin Kaiser, René Griessl, Nils Kucza, Carola Haumann, Lennart Tigges, Kevin Mika, Jens Hagemeyer, Florian Porrmann, Ulrich Rückert, Micha vor dem Berge, Stefan Krupop, Mario Porrmann, Marco Tassemeier, Pedro Trancoso, Fareed Qararyah, Stavroula Zouzoula, António Casimiro, Alysson Neves Bessani, José Cecílio, Stefan Andersson, Oliver Brunnegård, Olof Eriksson, Roland Weiss, Franz Meierhöfer, Hans Salomonsson, Elaheh Malekzadeh, Daniel Ödman, Anum Khurshid, Pascal Felber, Marcelo Pasin, Valerio Schiavoni, Jämes Ménétrey, Karol Gugala, Piotr Zierhoffer, Eric Knauss, Hans-Martin Heyn

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

2021

The Impact of Faults on DNNs: A Case Study.

Elaheh Malekzadeh, Nezam Rohbani, Zhonghai Lu, Masoumeh Ebrahimi

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021