F. Geenen

According to our database, F. Geenen authored at least 2 papers between 2022 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

The Concept of Safe Operating Area for Gate Dielectrics: the SiC/SiO2 Case Study.

Peter Moens, F. Geenen, L. De Schepper, JF Cano, J. Lettens, S. Maslougkas, J. Franchi, Martin Domeij

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Analysis and Modeling of Vth Shift in 4H-SiC MOSFETs at Room and Cryogenic-Temperature.

Fabrizio Masin, Carlo De Santi, Arno Stockman, J. Lettens, F. Geenen, Gaudenzio Meneghesso, Enrico Zanoni, Peter Moens, Matteo Meneghini

Proceedings of the IEEE International Reliability Physics Symposium, 2022