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M. Avramenko

Orcid: 0000-0002-2594-5989

According to our database1, M. Avramenko authored at least 4 papers between 2024 and 2025.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book  In proceedings  Article  PhD thesis  Dataset  Other 

Links

On csauthors.net:

Bibliography

2025
Recombination-Driven Interface Trap Generation in SiC MOSFETs Under Constant Voltage and Constant Current Stress.
[BibTeX]
[DOI]
Alberto Marcuzzi
,
M. Avramenko
,
Carlo De Santi
,
Peter Moens
,
G. J. Gomez Garcia
,
A. Feng
,
T. Grasser
,
Gaudenzio Meneghesso
,
Enrico Zanoni
,
Matteo Meneghini
Proceedings of the IEEE International Reliability Physics Symposium, 2025

2024
On the Intrinsic and Extrinsic Reliability Challenges of SiC MOSFETs.
[BibTeX]
[DOI]
Peter Moens
,
F. Geenen
,
M. Avramenko
,
G. Gomez-Garcia
,
Kevin Matocha
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Charge Trapping in SiC MOSFETs under Constant Gate Current Stress: Analysis Based on Charge Pumping Measurements.
[BibTeX]
[DOI]
Alberto Marcuzzi
,
M. Avramenko
,
Carlo De Santi
,
Peter Moens
,
F. Geenen
,
Gaudenzio Meneghesso
,
Enrico Zanoni
,
Matteo Meneghini
Proceedings of the IEEE International Reliability Physics Symposium, 2024

Threshold Voltage Drift and Recovery of SiC Trench MOSFETs During TDDB Stress.
[BibTeX]
[DOI]
M. Avramenko
,
L. De Schepper
,
J.-F. Cano
,
F. Geenen
,
Peter Moens
,
Alberto Marcuzzi
,
Carlo De Santi
,
Matteo Meneghini
Proceedings of the IEEE International Reliability Physics Symposium, 2024


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