Florent Cilici

According to our database, Florent Cilici authored at least 7 papers between 2018 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

A Wideband Model for a Stacked Millimeter-Wave Transformer-based Power Combiner.

Oumayma Belkhadra, Florent Cilici, Salvador Mir, Manuel J. Barragán, Gilles Montoriol, Emmanuel Pistono, Sylvain Bourdel

Proceedings of the 20th International Conference on PhD Research in Microelectronics and Electronics, 2025

2024

An Integrated Miniaturized VNA for On-Chip PA Mismatch Measurement.

Oumayma Belkhadra, Gilles Montoriol, Emmanuel Pistone, Hugo Vallee, Florent Cilici, Manuel J. Barragán, Salvador Mir, Sylvain Bourdel

Proceedings of the 22nd IEEE Interregional NEWCAS Conference, 2024

2022

Special Session on RF/5G Test.

William R. Eisenstadt, Mark Roos, Devin Morris, José Luis González-Jiménez, Christopery Mounet, Manuel J. Barragán, Gildas Léger, Florent Cilici, Estelle Lauga-Larroze, Salvador Mir, Sylvain Bourdel, Marc Margalef-Rovira, Issa Alaji, Haitham Ghanem, Guillaume Ducournau, Christophe Gaquière

Proceedings of the IEEE European Test Symposium, 2022

2019

Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits.

Florent Cilici, Gildas Léger, Manuel J. Barragán, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel

Proceedings of the 16th International Conference on Synthesis, 2019

Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration.

Florent Cilici, Manuel J. Barragán, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel, Gildas Léger

Proceedings of the IEEE International Symposium on Circuits and Systems, 2019

On the use of causal feature selection in the context of machine-learning indirect test.

Manuel J. Barragán, Gildas Léger, Florent Cilici, Estelle Lauga-Larroze, Sylvain Bourdel, Salvador Mir

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

Assisted test design for non-intrusive machine learning indirect test of millimeter-wave circuits.

Florent Cilici, Manuel J. Barragán, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel

Proceedings of the 23rd IEEE European Test Symposium, 2018