Frans G. M. de Jong

According to our database, Frans G. M. de Jong authored at least 15 papers between 1990 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2008

Analog Test Bus Infrastructure for RF/AMS Modules in Core-Based Design.

Vladimir A. Zivkovic, Frank van der Heyden, Guido Gronthoud, Frans G. M. de Jong

Proceedings of the 13th European Test Symposium, 2008

2007

SiP-test: Predicting delivery quality.

Alex S. Biewenga, Frans G. M. de Jong

Proceedings of the 2007 IEEE International Test Conference, 2007

2006

SiP-TAP: JTAG for SiP.

Frans G. M. de Jong, Alex S. Biewenga

Proceedings of the 2006 IEEE International Test Conference, 2006

2003

Board Test Coverage: The Value of Prediction and How to Compare Numbers.

Wouter Rijckaert, Frans G. M. de Jong

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

IEEE P1581: To Live or Let die?

Frans G. M. de Jong, Leon van de Logt

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Improved Test Monitor Circuit in Power Pin DfT.

Rodger Schuttert, Frans G. M. de Jong, Ben Kup

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

2001

Testing and programming flash memories on assemblies during high volume production.

Frans G. M. de Jong, Alex S. Biewenga, D. C. L. (Erik) van Geest, T. F. Waayers

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

System-level DFT for consumer products.

D. C. L. (Erik) van Geest, Frans G. M. de Jong

Proceedings of the 6th European Test Workshop, 2001

2000

Power pin testing: making the test coverage complete.

Frans G. M. de Jong, Ben Kup, Rodger Schuttert

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

Static component interconnection test technology in practice.

Frans G. M. de Jong, Rob Raaijmakers

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

SCITT: Back to Basics in Mass Production Testing.

Frans G. M. de Jong

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Static component interconnect test technology (SCITT) a new technology for assembly testing.

Alex S. Biewenga, Henk D. L. Hollmann, Frans G. M. de Jong, Maurice Lousberg

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1992

Memory Interconnection Test at Board Level.

Frans G. M. de Jong, Adriaan J. de Lind van Wijngaarden

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1991

Testing the Integrity of the Boundary Scan Test Infrastructure.

Frans G. M. de Jong, Frank van der Heyden

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1990

Boundary scan test used at board level: moving towards reality.

Frans G. M. de Jong

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990