N. Galbiati

According to our database1, N. Galbiati authored at least 2 papers between 2001 and 2005.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
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Links

On csauthors.net:

Bibliography

2005
Impact of interface and bulk trapped charges on transistor reliability.
Microelectron. Reliab., 2005

2001
Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling.
Microelectron. Reliab., 2001


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