G. Vanderschaeve

According to our database, G. Vanderschaeve authored at least 3 papers between 2005 and 2009.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2009

Characterization of ageing failures on power MOSFET devices by electron and ion microscopies.

Donatien Martineau, Thomas Mazeaud, Marc Legros, Philippe Dupuy, Colette Levade, G. Vanderschaeve

Microelectron. Reliab., 2009

2007

Characterization and modelling of ageing failures on power MOSFET devices.

B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, Emmanuel Scheid

Microelectron. Reliab., 2007

2005

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue.

B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin

Microelectron. Reliab., 2005