X. Chauffleur

According to our database, X. Chauffleur authored at least 4 papers between 2001 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

Virtual reliability assessment of integrated power switches based on multi-domain simulation approach.

Pierre Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi, Mauro Ciappa, X. Chauffleur, Jean-Pierre Fradin

Microelectron. Reliab., 2007

Characterization and modelling of ageing failures on power MOSFET devices.

B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, Emmanuel Scheid

Microelectron. Reliab., 2007

2005

Innovative Methodology for Predictive Reliability of Intelligent Power Devices Using Extreme Electro-thermal Fatigue.

B. Khong, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Marc Legros, A. Deram, Colette Levade, G. Vanderschaeve, Jean-Marie Dorkel, Jean-Pierre Fradin

Microelectron. Reliab., 2005

2001

Modeling Thermal Laser Stimulation.

Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2001