Emmanuel Scheid

According to our database, Emmanuel Scheid authored at least 5 papers between 2002 and 2009.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2009

On the accurate determination of the thermomechanical properties of micro-scale material: Application to AlSi_1% chip metallization of a power semiconductor device.

Jean-Baptiste Sauveplane, Emmanuel Scheid, A. Deram

Microelectron. Reliab., 2009

Boron diffusion and activation in polysilicon multilayer films for P⁺ MOS structure: Characterization and modeling.

Ramdane Mahamdi, Laurent Saci, Farida Mansour, Pierre Temple-Boyer, Emmanuel Scheid, Laurent Jalabert

Microelectron. J., 2009

2008

3D electro-thermal investigations for reliability of ultra low ON state resistance power MOSFET.

Jean-Baptiste Sauveplane, Patrick Tounsi, Emmanuel Scheid, A. Deram

Microelectron. Reliab., 2008

2007

Characterization and modelling of ageing failures on power MOSFET devices.

B. Khong, Marc Legros, Patrick Tounsi, Philippe Dupuy, X. Chauffleur, Colette Levade, G. Vanderschaeve, Emmanuel Scheid

Microelectron. Reliab., 2007

2002

Characterization method of thermomechanical parameters for microelectronic materials.

Oliver Perat, Jean-Marie Dorkel, Emmanuel Scheid, Pierre Temple-Boyer, Y. S. Chung, A. Peyre-Lavigne, M. Zecri, Patrick Tounsi

Microelectron. Reliab., 2002