George Kamoulakos

According to our database1, George Kamoulakos authored at least 14 papers between 2000 and 2008.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2008
A 65 nm CMOS Multistandard, Multiband TV Tuner for Mobile and Multimedia Applications.
IEEE J. Solid State Circuits, 2008

2007
A 65nm CMOS multi-standard, multi-band mobile TV tuner.
Proceedings of the 33rd European Solid-State Circuits Conference, 2007

2006
CMOS tuners for mobile TV.
IEEE Commun. Mag., 2006

A 0.18µm CMOS Dual-Band Direct-Conversion DVB-H Receiver.
Proceedings of the 2006 IEEE International Solid State Circuits Conference, 2006

2004
A dual-band 5.15-5.35-GHz, 2.4-2.5-GHz 0.18-μm CMOS transceiver for 802.11a/b/g wireless LAN.
IEEE J. Solid State Circuits, 2004

A cost-efficient 0.18 μm CMOS RF transceiver using a fractional-N synthesizer for 802.11b/g wireless LAN applications.
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004

2003
Σχεδίαση, χαρακτηρισμός και μελέτη αξιοπιστίας πρωτότυπων διατάξεων μνήμης τύπου 'αστραπής' (flash memory) και των περιφερειακών κυκλωμάτων λειτουργίας αυτής
PhD thesis, 2003

A single-chip digitally calibrated 5.15-5.825-GHz 0.18-μm CMOS transceiver for 802.11a wireless LAN.
IEEE J. Solid State Circuits, 2003

A single-chip, 5.15GHz-5.35GHz, 2.4GHz-2.5GHz, 0.18μm CMOS RF transceiver for 802.11a/b/g wireless LAN.
Proceedings of the ESSCIRC 2003, 2003

2002
An extra low noise 1.8 GHz voltage controlled oscillator in 0.35 SiGe BiCMOS technology.
Proceedings of the 2002 9th IEEE International Conference on Electronics, 2002

2001
A 0.35 μm SiGe BiCMOS front end for GSM low IF cellular receiver applications.
Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001

2000
Management of charge pump circuits.
Integr., 2000

New memory sense amplifier designs in CMOS technology.
Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000

A test pattern generation unit for memory NPSF built-in self test.
Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000


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