Themistoklis Haniotakis

According to our database1, Themistoklis Haniotakis authored at least 69 papers between 1995 and 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2020
A Built In Test circuit for waveform classification at high frequencies.
Proceedings of the 29th IEEE North Atlantic Test Workshop, 2020

ARIAN: A Scalable Method for Adding aRbItrAry Numbers on Modern Processors.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

2019
Implementation Guidelines of WDSRAM and Comparison with Typical SRAM Using Nanoscale Hierarchical Implementation Model.
J. Circuits Syst. Comput., 2019

Power efficient synchronous counter design.
Comput. Electr. Eng., 2019

2018
A Generalized Approach to Implement Efficient CMOS-Based Threshold Logic Functions.
IEEE Trans. Circuits Syst. I Regul. Pap., 2018

A 1Kx32 bit WDSRAM page with rapid write access.
Proceedings of the 13th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2018

2017
Delay Analysis for Current Mode Threshold Logic Gate Designs.
IEEE Trans. Very Large Scale Integr. Syst., 2017

More Efficient Testing of Metal-Oxide Memristor-Based Memory.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

An enhanced approach to reduce test application time through limited shift operations in scan chains.
Proceedings of the 2017 IEEE North Atlantic Test Workshop, 2017

High Speed Power Efficient Carry Select Adder Design.
Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017

Reducing power, area, and delay of threshold logic gates considering non-integer weights.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2017

A new method to identify threshold logic functions.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016
ATPG for Delay Defects in Current Mode Threshold Logic Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Low-Power and High Performance Sinusoidal Clocked Dynamic Circuit Design.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2016

Identification of delay defects on embedded paths using one current sensor.
Proceedings of the 2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era, 2016

2015
A current monitoring technique for I<sub>DDQ</sub> testing in digital integrated circuits.
Integr., 2015

Fast march tests for defects in resistive memory.
Proceedings of the 2015 IEEE/ACM International Symposium on Nanoscale Architectures, 2015

2014
Implementation of a Low Leakage Standard Cell Library based on materials from UMC 65nm technology.
Proceedings of the 18th Panhellenic Conference on Informatics, 2014

ATPG for transition faults of pipelined threshold logic circuits.
Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

Diagnosis of segment delay defects with current sensing.
Proceedings of the 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2014

2013
Low power and high speed current-mode memristor-based TLGs.
Proceedings of the 2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2013

2012
Securing sensor networks: A novel approach that combines encoding, uncorrelation and node disjoint transmission.
Ad Hoc Networks, 2012

Delay Analysis for an N-Input Current Mode Threshold Logic Gate.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2012

2011
A Metric for Weight Assignment to Optimize the Performance of MOBILE Threshold Logic Gate.
Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011

2010
A Data Capturing Method for Buses on Chip.
IEEE Trans. Circuits Syst. I Regul. Pap., 2010

Memory-Less Pipeline Dynamic Circuit Design Technique.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2010

2008
A Current Mode, Parallel, Two-Rail Code Checker.
IEEE Trans. Computers, 2008

A High-Performance Bus Architecture for Strongly Coupled Interconnects.
Proceedings of the 9th International Symposium on Quality of Electronic Design (ISQED 2008), 2008

2007
A Methodology for Transistor-Efficient Supergate Design.
IEEE Trans. Very Large Scale Integr. Syst., 2007

Testable Designs of Multiple Precharged Domino Circuits.
IEEE Trans. Very Large Scale Integr. Syst., 2007

Glitch Control with Dynamic Receiver Threshold Adjustment.
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

Transistor-Level Synthesis for Low-Power Applications.
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

2006
A Design Technique for Energy Reduction in NORA CMOS Logic.
IEEE Trans. Circuits Syst. I Regul. Pap., 2006

Transistor-Level Optimization of Supergates.
Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

An Improved Method for Identifying Linear Dependencies in Path Delay Faults.
Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006

A Pipeline Architecture Incorporating a Low-Cost Error Detection and Correction Mechanism.
Proceedings of the 13th IEEE International Conference on Electronics, 2006

2005
The Use of Pre-Evaluation Phase in Dynamic CMOS Logic.
Proceedings of the 2005 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2005), 2005

Design and Evaluation of a Security Scheme for Sensor Networks.
Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005

Reduced Test Application Time Based on Reachability Analysis.
Proceedings of the 6th International Symposium on Quality of Electronic Design (ISQED 2005), 2005

Fast, Parallel Two-Rail Code Checker with Enhanced Testability.
Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

An embedded IDDQ testing circuit and technique.
Proceedings of the 12th IEEE International Conference on Electronics, 2005

A security protocol for sensor networks.
Proceedings of the Global Telecommunications Conference, 2005. GLOBECOM '05, St. Louis, Missouri, USA, 28 November, 2005

A built-in I<sub>DDQ</sub> testing circuit.
Proceedings of the 31st European Solid-State Circuits Conference, 2005

2004
A unified framework for generating all propagation functions for logic errors and events.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

A Circuit for Concurrent Detection of Soft and Timing Errors in Digital CMOS ICs.
J. Electron. Test., 2004

Ultra Fast and Low Cost Parallel Two-Rail Code Checker Targeting High Fan-In Applications .
Proceedings of the 2004 IEEE Computer Society Annual Symposium on VLSI (ISVLSI 2004), 2004

A New Dynamic Circuit Design Technique for High Performance TSC Checker Implementations.
Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

Security enhancement through multiple path transmission in ad hoc networks.
Proceedings of IEEE International Conference on Communications, 2004

2003
An Embedded IDDQ Testing Architecture and Technique.
Proceedings of the 4th International Symposium on Quality of Electronic Design (ISQED 2003), 2003

A Sense Amplifier Based Circuit for Concurrent Detection of Soft and Timing Errors in CMOS ICs.
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

A low power NORA circuit design technique based on charge recycling.
Proceedings of the 2003 10th IEEE International Conference on Electronics, 2003

2002
A new technique for IDDQ testing in nanometer technologies.
Integr., 2002

Extending the Viability of IDDQ Testing in the Deep Submicron Era.
Proceedings of the 3rd International Symposium on Quality of Electronic Design, 2002

SRAM oriented memory sense amplifier design in 0.18 μm CMOS technology.
Proceedings of the 2002 International Symposium on Circuits and Systems, 2002

A Hierarchical Architecture for Concurrent Soft Error Detection Based on Current Sensing.
Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002

2001
Concurrent Detection of Soft Errors Based on Current Monitoring.
Proceedings of the 7th IEEE International On-Line Testing Workshop (IOLTW 2001), 2001

New test pattern generation units for NPSF oriented memory built-in self test.
Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001

2000
On Testability of Multiple Precharged Domino Logic.
Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000

A Compact Built-In Current Sensor for IDDQ Testing.
Proceedings of the 6th IEEE International On-Line Testing Workshop (IOLTW 2000), 2000

New memory sense amplifier designs in CMOS technology.
Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000

A state assignment algorithm for finite state machines.
Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000

A Versatile Built-In Self-Test Scheme for Delay Fault Testing.
Proceedings of the 2000 Design, 2000

1999
Novel domino logic designs.
Proceedings of the 6th IEEE International Conference on Electronics, Circuits and Systems, 1999

On Path Delay Fault Testing of Multiplexer - Based Shifters.
Proceedings of the 9th Great Lakes Symposium on VLSI (GLS-VLSI '99), 1999

A Zero Aliasing Built-In Self Test Technique for Delay Fault Testing.
Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks.
Proceedings of the 1999 Design, 1999

1998
C-Testable One-Dimensional ILAs with Respect to Path Delay Faults: Theory and Applications.
Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

1995
Efficient Totally Self-Checking Checkers for a Class of Borden Codes.
IEEE Trans. Computers, 1995

An efficient comparative concurrent Built-In Self-Test technique.
Proceedings of the 4th Asian Test Symposium (ATS '95), 1995


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