Georgios Volanis

According to our database, Georgios Volanis authored at least 8 papers between 2015 and 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Range-Controlled Floating-Gate Transistors: A Unified Solution for Unlocking and Calibrating Analog ICs.

Sai Govinda Rao Nimmalapudi, Georgios Volanis, Yichuan Lu, Angelos Antonopoulos, Andrew Marshall, Yiorgos Makris

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Analog Performance Locking through Neural Network-Based Biasing.

Georgios Volanis, Yichuan Lu, Sai Govinda Rao Nimmalapudi, Angelos Antonopoulos, Andrew Marshall, Yiorgos Makris

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Post-Production Calibration of Analog/RF ICs: Recent Developments and A Fully Integrated Solution.

Angelos Antonopoulos, Georgios Volanis, Yichuan Lu, Yiorgos Makris

Proceedings of the 16th International Conference on Synthesis, 2019

Trusted and Secure Design of Analog/RF ICs: Recent Developments.

Kiruba S. Subramani, Georgios Volanis, Mohammad-Mahdi Bidmeshki, Angelos Antonopoulos, Yiorgos Makris

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2017

Knob non-idealities in learning-based post-production tuning of analog/RF ICs: Impact & remedies.

Yichuan Lu, Georgios Volanis, Kiruba S. Subramani, Angelos Antonopoulos, Yiorgos Makris

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2016

Toward Silicon-Based Cognitive Neuromorphic ICs - A Survey.

Georgios Volanis, Angelos Antonopoulos, Alkis A. Hatzopoulos, Yiorgos Makris

IEEE Des. Test, 2016

On-die learning-based self-calibration of analog/RF ICs.

Georgios Volanis, Dzmitry Maliuk, Yichuan Lu, Kiruba S. Subramani, Angelos Antonopoulos, Yiorgos Makris

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015

Concurrent hardware Trojan detection in wireless cryptographic ICs.

Yu Liu, Georgios Volanis, Ke Huang, Yiorgos Makris

Proceedings of the 2015 IEEE International Test Conference, 2015