Ke Huang

Orcid: 0000-0002-1587-9877

Affiliations:

San Diego State University, Department of Electrical and Computer Engineering, CA, USA
University of Texas at Dallas, Richardson, TX, USA (2012 - 2014)
University of Grenoble, France (PhD 2011)
Joseph Fourier University, Grenoble I University, Grenoble, France, (former)

According to our database¹, Ke Huang authored at least 36 papers between 2012 and 2024.

Collaborative distances:

Dijkstra number² of four.
Erdős number³ of three.

Timeline

Legend:

Book

In proceedings

Article

PhD thesis

Dataset

Other

Bibliography

2024

Statistical Methods for Detecting Recycled Electronics: From ICs to PCBs and Beyond.

[BibT_eX]

[DOI]

IEEE Des. Test, 2024

2023

AdaTest: Reinforcement Learning and Adaptive Sampling for On-chip Hardware Trojan Detection.

[BibT_eX]

[DOI]

ACM Trans. Embed. Comput. Syst., March, 2023

zPROBE: Zero Peek Robustness Checks for Federated Learning.

[BibT_eX]

[DOI]

Proceedings of the IEEE/CVF International Conference on Computer Vision, 2023

2022

DEVoT: Dynamic Delay Modeling of Functional Units Under Voltage and Temperature Variations.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

An Adaptive Black-box Backdoor Detection Method for Deep Neural Networks.

[BibT_eX]

[DOI]

CoRR, 2022

FaceSigns: Semi-Fragile Neural Watermarks for Media Authentication and Countering Deepfakes.

[BibT_eX]

[DOI]

CoRR, 2022

2021

Eco-Driving System for Connected Automated Vehicles: Multi-Objective Trajectory Optimization.

[BibT_eX]

[DOI]

IEEE Trans. Intell. Transp. Syst., 2021

Real-Time IC Aging Prediction via On-Chip Sensors.

[BibT_eX]

[DOI]

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2021

On the Application of Binary Neural Networks in Oblivious Inference.

[BibT_eX]

[DOI]

Proceedings of the IEEE Conference on Computer Vision and Pattern Recognition Workshops, 2021

2019

Real-Time Prediction for IC Aging Based on Machine Learning.

[BibT_eX]

[DOI]

Ke Huang

Xinqiao Zhang

Naghmeh Karimi

IEEE Trans. Instrum. Meas., 2019

2018

Ecological Driving System for Connected/Automated Vehicles Using a Two-Stage Control Hierarchy.

[BibT_eX]

[DOI]

Prathyusha Kondlapudi

IEEE Trans. Intell. Transp. Syst., 2018

Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning.

[BibT_eX]

[DOI]

Parth Kansara

Sharanabasavaraja Bheema Reddy

Louay Abdallah

Ke Huang

J. Electron. Test., 2018

Guest Editorial: Special Issue on Analog, Mixed-Signal, and RF Testing.

[BibT_eX]

[DOI]

Ke Huang

Manuel J. Barragán

J. Electron. Test., 2018

AgileNet: Lightweight Dictionary-based Few-shot Learning.

[BibT_eX]

[DOI]

CoRR, 2018

IC layout weak point effectiveness evaluation based on statistical methods.

[BibT_eX]

[DOI]

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

2017

Yield Forecasting Across Semiconductor Fabrication Plants and Design Generations.

[BibT_eX]

[DOI]

Ali Ahmadi

Haralampos-G. D. Stratigopoulos

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

2016

Test-Suite-Based Analog/RF Test Time Reduction Using Canonical Correlation.

[BibT_eX]

[DOI]

Ke Huang

Jian Wen

Jim Willmore

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Prognosis of NBTI aging using a machine learning scheme.

[BibT_eX]

[DOI]

Naghmeh Karimi

Ke Huang

Proceedings of the 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2016

2015

Recycled IC Detection Based on Statistical Methods.

[BibT_eX]

[DOI]

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Low-Cost Analog/RF IC Testing Through Combined Intra- and Inter-Die Correlation Models.

[BibT_eX]

[DOI]

Ke Huang

Nathan Kupp

Constantinos Xanthopoulos

John M. Carulli Jr.

Yiorgos Makris

IEEE Des. Test, 2015

Yield prognosis for fab-to-fab product migration.

[BibT_eX]

[DOI]

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

A comparative study of one-shot statistical calibration methods for analog / RF ICs.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Test Conference, 2015

Concurrent hardware Trojan detection in wireless cryptographic ICs.

[BibT_eX]

[DOI]

Proceedings of the 2015 IEEE International Test Conference, 2015

2014

Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain.

[BibT_eX]

[DOI]

Proc. IEEE, 2014

Innovative practices session 4C: Disruptive solutions in the non-digital world.

[BibT_eX]

[DOI]

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

IC laser trimming speed-up through wafer-level spatial correlation modeling.

[BibT_eX]

[DOI]

Constantinos Xanthopoulos

Proceedings of the 2014 International Test Conference, 2014

Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.

[BibT_eX]

[DOI]

Ali Ahmadi

Ke Huang

Suriyaprakash Natarajan

John M. Carulli Jr.

Yiorgos Makris

Proceedings of the 2014 International Test Conference, 2014

Hardware Trojan Detection through Golden Chip-Free Statistical Side-Channel Fingerprinting.

[BibT_eX]

[DOI]

Yu Liu

Ke Huang

Yiorgos Makris

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

2013

Process monitoring through wafer-level spatial variation decomposition.

[BibT_eX]

[DOI]

Proceedings of the 2013 IEEE International Test Conference, 2013

Counterfeit electronics: A rising threat in the semiconductor manufacturing industry.

[BibT_eX]

[DOI]

Ke Huang

John M. Carulli

Yiorgos Makris

Proceedings of the 2013 IEEE International Test Conference, 2013

Reconciling the IC test and security dichotomy.

[BibT_eX]

[DOI]

Ozgur Sinanoglu

Naghmeh Karimi

Jeyavijayan Rajendran

Proceedings of the 18th IEEE European Test Symposium, 2013

On combining alternate test with spatial correlation modeling in analog/RF ICs.

[BibT_eX]

[DOI]

Proceedings of the 18th IEEE European Test Symposium, 2013

Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests.

[BibT_eX]

[DOI]

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Spatial estimation of wafer measurement parameters using Gaussian process models.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE International Test Conference, 2012

Spatial correlation modeling for probe test cost reduction in RF devices.

[BibT_eX]

[DOI]

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

Parametric counterfeit IC detection via Support Vector Machines.

[BibT_eX]

[DOI]

Ke Huang

John M. Carulli Jr.

Yiorgos Makris

Proceedings of the 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2012

Ke Huang

Timeline

Legend:

Links

Online presence:

On csauthors.net:

Bibliography

Loading...