Yichuan Lu

According to our database, Yichuan Lu authored at least 9 papers between 2015 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2025

CLLMRec: LLM-powered Cognitive-Aware Concept Recommendation via Semantic Alignment and Prerequisite Knowledge Distillation.

Xiangrui Xiong, Yichuan Lu, Zifei Pan, Chang Sun

CoRR, November, 2025

2020

Range-Controlled Floating-Gate Transistors: A Unified Solution for Unlocking and Calibrating Analog ICs.

Sai Govinda Rao Nimmalapudi, Georgios Volanis, Yichuan Lu, Angelos Antonopoulos, Andrew Marshall, Yiorgos Makris

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Analog Performance Locking through Neural Network-Based Biasing.

Georgios Volanis, Yichuan Lu, Sai Govinda Rao Nimmalapudi, Angelos Antonopoulos, Andrew Marshall, Yiorgos Makris

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Post-Production Calibration of Analog/RF ICs: Recent Developments and A Fully Integrated Solution.

Angelos Antonopoulos, Georgios Volanis, Yichuan Lu, Yiorgos Makris

Proceedings of the 16th International Conference on Synthesis, 2019

2018

On the use of Bayesian Networks for Resource-Efficient Self-Calibration of Analog/RF ICs.

Martin Andraud, Laura Isabel Galindez Olascoaga, Yichuan Lu, Yiorgos Makris, Marian Verhelst

Proceedings of the IEEE International Test Conference, 2018

2017

Knob non-idealities in learning-based post-production tuning of analog/RF ICs: Impact & remedies.

Yichuan Lu, Georgios Volanis, Kiruba S. Subramani, Angelos Antonopoulos, Yiorgos Makris

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2016

On-die learning-based self-calibration of analog/RF ICs.

Georgios Volanis, Dzmitry Maliuk, Yichuan Lu, Kiruba S. Subramani, Angelos Antonopoulos, Yiorgos Makris

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015

A comparative study of one-shot statistical calibration methods for analog / RF ICs.

Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Ke Huang, Yiorgos Makris

Proceedings of the 2015 IEEE International Test Conference, 2015

Silicon Demonstration of Statistical Post-Production Tuning.

Yichuan Lu, Kiruba S. Subramani, He Huang, Nathan Kupp, Yiorgos Makris

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015