Ghil-Geun Oh
According to our database1,
Ghil-Geun Oh
authored at least 4 papers
between 2014 and 2021.
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Bibliography
2021
Dynamic Voltage Stress Sensing Circuits for Screening Out Early Device Reliability Issues in Advanced Technology Nodes.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2021
2020
Cost-Effective Test Method for screening out Unexpected Failure in High Speed Serial Interface IPs.
Proceedings of the IEEE International Test Conference, 2020
2019
Advanded Design Verification and Debugging Techniques Based on Optical Fault Isolation Method.
Proceedings of the 2019 International SoC Design Conference, 2019
2014
A 10-Bit 40-MS/s Pipelined ADC With a Wide Range Operating Temperature for WAVE Applications.
IEEE Trans. Circuits Syst. II Express Briefs, 2014