Grazia Sasso

According to our database, Grazia Sasso authored at least 3 papers between 2010 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit.

Thomas Jacquet, Grazia Sasso, Anjan Chakravorty, Niccolò Rinaldi, Klaus Aufinger, Thomas Zimmer, Vincenzo d'Alessandro, Cristell Maneux

Microelectron. Reliab., 2015

Ageing and thermal recovery of advanced SiGe heterojunction bipolar transistors under long-term mixed-mode and reverse stress conditions.

Gerhard G. Fischer, Grazia Sasso

Microelectron. Reliab., 2015

2010

Avalanche multiplication and pinch-in models for simulating electrical instability effects in SiGe HBTs.

Grazia Sasso, Maurizio Costagliola, Niccolò Rinaldi

Microelectron. Reliab., 2010