Gurjeet S. Saund

According to our database, Gurjeet S. Saund authored at least 4 papers between 1995 and 1999.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1999

A functional-level testability measure for register-level circuits and its estimation.

C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal

Microprocess. Microsystems, 1999

1998

Partial Scan Selection Based on Dynamic Reachability and Observability Information.

Michael S. Hsiao, Gurjeet S. Saund, Elizabeth M. Rudnick, Janak H. Patel

Proceedings of the 11th International Conference on VLSI Design (VLSI Design 1991), 1998

1997

Partial Scan beyond Cycle Cutting.

Gurjeet S. Saund, Michael S. Hsiao, Janak H. Patel

Proceedings of the Digest of Papers: FTCS-27, 1997

1995

A STAFAN-like functional testability measure for register-level circuits.

C. P. Ravikumar, Gurjeet S. Saund, Nidhi Agrawal

Proceedings of the 4th Asian Test Symposium (ATS '95), 1995