Haissam Ziade

According to our database, Haissam Ziade authored at least 10 papers between 1985 and 2016.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2016

Hardware implementation of a fault-tolerant Hopfield Neural Network on FPGAs.

Juan Antonio Clemente, Wassim Mansour, Rafic Ayoubi, Felipe Serrano, Hortensia Mecha, Haissam Ziade, Wassim El Falou, Raoul Velazco

Neurocomputing, 2016

2013

Fault-tolerance capabilities of a software-implemented Hopfield Neural Network.

Wassim Mansour, Raoul Velazco, Rafic Ayoubi, Wassim El Falou, Haissam Ziade

Proceedings of the Third International Conference on Communications and Information Technology, 2013

2011

A new fault injection approach to study the impact of bitflips in the configuration of SRAM-based FPGAs.

Haissam Ziade, Rafic A. Ayoubi, Raoul Velazco, Tareck Idriss

Int. Arab J. Inf. Technol., 2011

An Optimal Implementation on FPGA of a Hopfield Neural Network.

Wassim Mansour, Rafic A. Ayoubi, Haissam Ziade, Raoul Velazco, Wassim El Falou

Adv. Artif. Neural Syst., 2011

2004

A Survey on Fault Injection Techniques.

Haissam Ziade, Rafic A. Ayoubi, Raoul Velazco

Int. Arab J. Inf. Technol., 2004

Hopfield associative memory on mesh.

Rafic A. Ayoubi, Haissam Ziade, Magdy A. Bayoumi

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

2003

Assessing the Soft Error Rate of Digital Architectures Devoted to Operate in Radiation Environment: A Case Studied.

Raoul Velazco, Sana Rezgui, Haissam Ziade

J. Electron. Test., 2003

Fault Tolerant Hopfield Associative Memory on Torus.

Rafic A. Ayoubi, Haissam Ziade, Magdy A. Bayoumi

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

1988

Analysis of Experimental Results on Functional Testing and Diagnosis of Complex Circuits.

Catherine Bellon, Raoul Velazco, Haissam Ziade

Proceedings of the Proceedings International Test Conference 1988, 1988

1985

A Microprocessor Test Approach Allowing Fault Localization.

Raoul Velazco, Haissam Ziade, E. Kolokithas

Proceedings of the Proceedings International Test Conference 1985, 1985