Haoze Luo

Orcid: 0000-0001-5103-5068

According to our database1, Haoze Luo authored at least 12 papers between 2015 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2023
Investigation of Off-State Stress Induced Degradation of SiC MOSFETs Under Short-Circuit Condition.
IEEE Trans. Ind. Electron., 2023

2019
AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer.
IEEE Trans. Ind. Electron., 2019

2018
Enabling Junction Temperature Estimation via Collector-Side Thermo-Sensitive Electrical Parameters Through Emitter Stray Inductance in High-Power IGBT Modules.
IEEE Trans. Ind. Electron., 2018

On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition.
Microelectron. Reliab., 2018

Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter.
Microelectron. Reliab., 2018

2017
Uneven temperature effect evaluation in high-power IGBT inverter legs and relative test platform design.
Microelectron. Reliab., 2017

Die degradation effect on aging rate in accelerated cycling tests of SiC power MOSFET modules.
Microelectron. Reliab., 2017

Separation test method for investigation of current density effects on bond wires of SiC power MOSFET modules.
Proceedings of the IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, Beijing, China, October 29, 2017

2016
Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview.
Microelectron. Reliab., 2016

2015
Theoretical Evaluation of Stability Improvement Brought by Resonant Current Loop for Paralleled LLC Converters.
IEEE Trans. Ind. Electron., 2015

Decoupling-Controlled Triport Composited DC/DC Converter for Multiple Energy Interface.
IEEE Trans. Ind. Electron., 2015

Topology Review and Derivation Methodology of Single-Phase Transformerless Photovoltaic Inverters for Leakage Current Suppression.
IEEE Trans. Ind. Electron., 2015


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