Harsh Rawat

According to our database1, Harsh Rawat authored at least 10 papers between 2014 and 2023.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
A Common Mode Insensitive Process Tolerant Sense Amplifier Design for In Memory Compute Applications in 65nm LSTP Technology.
Proceedings of the 36th International Conference on VLSI Design and 2023 22nd International Conference on Embedded Systems, 2023

A 40-310TOPS/W SRAM-Based All-Digital Up to 4b In-Memory Computing Multi-Tiled NN Accelerator in FD-SOI 18nm for Deep-Learning Edge Applications.
Proceedings of the IEEE International Solid- State Circuits Conference, 2023

2022
Retention Problem Free High Density 4T SRAM cell with Adaptive Body Bias in 18nm FD-SOI.
Proceedings of the 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems, 2022

3-Stage Pipelined Hierarchical SRAMs with Burst Mode Read in 65nm LSTP CMOS.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

A Process and Data Variations Tolerant Capacitive Coupled 10T1C SRAM for In-Memory Compute (IMC) in Deep Neural Network Accelerators.
Proceedings of the 4th IEEE International Conference on Artificial Intelligence Circuits and Systems, 2022

2021
Charge Scavenging Gate Coupled Hierarchical Bitline Scheme for Ultra-Low Power SRAMs in 65nm LSTP CMOS.
Proceedings of the 28th IEEE International Conference on Electronics, 2021

2017
Asynchronous 1R-1W dual-port SRAM by using single-port SRAM in 28nm UTBB-FDSOI technology.
Proceedings of the 30th IEEE International System-on-Chip Conference, 2017

2015
FALPEM: Framework for Architectural-Level Power Estimation and Optimization for Large Memory Sub-Systems.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

A 6T SRAM cell based pipelined 2R/1W memory design using 28nm UTBB-FDSOI.
Proceedings of the 28th IEEE International System-on-Chip Conference, 2015

2014
Write Assist Circuit to Cater Reliability and Floating Bit Line Problem of Negative Bit Line Assist Technique for Single or Multiport Static Random Access Memory.
IEEE Trans. Very Large Scale Integr. Syst., 2014


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