Haruki Yokoyama

According to our database, Haruki Yokoyama authored at least 17 papers between 2002 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

An Exploratory Study of AI System Risk Assessment from the Lens of Data Distribution and Uncertainty.

Zhijie Wang, Yuheng Huang, Lei Ma, Haruki Yokoyama, Susumu Tokumoto, Kazuki Munakata

CoRR, 2022

Verifying Attention Robustness of Deep Neural Networks against Semantic Perturbations.

Satoshi Munakata, Caterina Urban, Haruki Yokoyama, Koji Yamamoto, Kazuki Munakata

Proceedings of the 29th Asia-Pacific Software Engineering Conference, 2022

2021

Sirius: Static Program Repair with Dependence Graph-Based Systematic Edit Patterns.

Kunihiro Noda, Haruki Yokoyama, Shinji Kikuchi

Proceedings of the IEEE International Conference on Software Maintenance and Evolution, 2021

2020

Towards Building Robust DNN Applications: An Industrial Case Study of Evolutionary Data Augmentation.

Haruki Yokoyama, Satoshi Onoue, Shinji Kikuchi

Proceedings of the 35th IEEE/ACM International Conference on Automated Software Engineering, 2020

2019

Machine Learning System Architectural Pattern for Improving Operational Stability.

Haruki Yokoyama

Proceedings of the IEEE International Conference on Software Architecture Companion, 2019

2017

Evaluating Automated Program Repair Using Characteristics of Defects.

Haruki Yokoyama, Yoshiki Higo, Shinji Kusumoto

Proceedings of the 8th International Workshop on Empirical Software Engineering in Practice, 2017

New Strategies for Selecting Reuse Candidates on Automated Program Repair.

Akito Tanikado, Haruki Yokoyama, Masahiro Yamamoto, Soichi Sumi, Yoshiki Higo, Shinji Kusumoto

Proceedings of the 41st IEEE Annual Computer Software and Applications Conference, 2017

2016

Toward improving ability to repair bugs automatically: a patch candidate location mechanism using code similarity.

Haruki Yokoyama, Yoshiki Higo, Keisuke Hotta, Takafumi Ohta, Kozo Okano, Shinji Kusumoto

Proceedings of the 31st Annual ACM Symposium on Applied Computing, 2016

Toward Developer-like Automated Program Repair - Modification Comparisons between GenProg and Developers.

Hiroki Nakajima, Yoshiki Higo, Haruki Yokoyama, Shinji Kusumoto

Proceedings of the 23rd Asia-Pacific Software Engineering Conference, 2016

2014

High-speed avalanche photodiodes for 100-Gb/s systems and beyond.

Masahiro Nada, Yoshifumi Muramoto, Haruki Yokoyama, Toshihide Yoshimatsu, Hideaki Matsuzaki

Proceedings of the European Conference on Optical Communication, 2014

400-G coherent receiver using silica-based heterogeneously-integrated PLC with newly developed waveplate type PBS.

Yu Kurata, Yasuaki Hashizume, Shinichi Aozasa, Mikitaka Itoh, Toshikazu Hashimoto, Hiromasa Tanobe, Yasuhiko Nakanishi, Eiji Yoshida, Hiroyuki Fukuyama, Hiroshi Yamazaki, Takashi Goh, Haruki Yokoyama, Yoshifumi Muramoto

Proceedings of the European Conference on Optical Communication, 2014

2012

Estimation of Transit Time in Terahertz Oscillating Resonant Tunneling Diodes with Graded Emitter and Thin Barriers.

Atsushi Teranishi, Safumi Suzuki, Kaoru Shizuno, Masahiro Asada, Hiroki Sugiyama, Haruki Yokoyama

IEICE Trans. Electron., 2012

Fundamental oscillation up to 1.08THz in resonant tunneling diodes with high-indium-composition transit layers for reduction of transit delay.

Atsushi Teranishi, Kaoru Shizuno, Safumi Suzuki, Masahiro Asada, Hiroki Sugiyama, Haruki Yokoyama

IEICE Electron. Express, 2012

2005

Velocity dispersion in GaN-based surface acoustic wave filters on (0001) sapphire substrates.

Naoteru Shigekawa, Kazumi Nishimura, Haruki Yokoyama, Kenji Shiojima, Kohji Hohkawa

IEICE Electron. Express, 2005

SAW characteristics of GaN layers with surfaces exposed by dry etching.

Kazumi Nishimura, Naoteru Shigekawa, Haruki Yokoyama, Masanobu Hiroki, Kohji Hohkawa

IEICE Electron. Express, 2005

2004

Suppression of short-channel effect in pseudomorphic In0.25Al0.75P/In0.75Ga0.25As high electron mobility transistors.

Hideaki Matsuzaki, Hiroki Sugiyama, Haruki Yokoyama, Takashi Kobayashi, Takatomo Enoki

IEICE Electron. Express, 2004

2002

Bias-stress-induced increase in parasitic resistance of InP-based InAlAs/InGaAs HEMTs.

Tetsuya Suemitsu, Yoshino K. Fukai, Hiroki Sugiyama, Kazuo Watanabe, Haruki Yokoyama

Microelectron. Reliab., 2002