Hongqin Lyu
Orcid: 0000-0002-4942-6964
According to our database1,
Hongqin Lyu authored at least 17 papers
between 2021 and 2026.
Collaborative distances:
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Bibliography
2026
Arcane: An Assertion Reduction Framework through Semantic Clustering and MCTS-Guided Rule Exploring.
CoRR, May, 2026
From Indiscriminate to Targeted: Efficient RTL Verification via Functionally Key Signal-Driven LLM Assertion Generation.
CoRR, April, 2026
Iterative LLM-Based Assertion Generation Using Syntax-Semantic Representations for Functional Coverage-Guided Verification.
CoRR, February, 2026
AssertMiner-pro: Enhanced module-level spec generation and assertion mining with LLM guided by top-down hierarchical strategies.
Integr., 2026
CoverAssert: Iterative LLM Assertion Generation Driven by Functional Coverage via Syntax-Semantic Representations.
Proceedings of the Design, Automation & Test in Europe Conference, 2026
AssertMiner: Module-Level Spec Generation and Assertion Mining using Static Analysis Guided LLMs.
Proceedings of the 31st Asia and South Pacific Design Automation Conference, 2026
2025
CoRR, September, 2025
DeepAssert: An LLM-Aided Verification Framework with Fine-Grained Assertion Generation for Modules with Extracted Module Specifications.
CoRR, September, 2025
Proceedings of the 43rd IEEE VLSI Test Symposium, 2025
TESLA: Testability Enhancement for Shift-Left Automation via Multi-LLM Collaboration.
Proceedings of the IEEE International Test Conference, 2025
Proceedings of the 24th International Conference on Autonomous Agents and Multiagent Systems, 2025
AssertGen: Enhancement of LLM-aided Assertion Generation through Cross-Layer Signal Bridging.
Proceedings of the 34th IEEE Asian Test Symposium, 2025
2024
Proceedings of the IEEE International Test Conference in Asia, 2024
SmartATPG: Learning-based Automatic Test Pattern Generation with Graph Convolutional Network and Reinforcement Learning.
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024
2023
CAAI Trans. Intell. Technol., December, 2023
Intelligent Automatic Test Pattern Generation for Digital Circuits Based on Reinforcement Learning.
Proceedings of the 32nd IEEE Asian Test Symposium, 2023
2021
Proceedings of the Parallel and Distributed Computing, Applications and Technologies, 2021