Hsunwei Hsiung

According to our database, Hsunwei Hsiung authored at least 5 papers between 2012 and 2015.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2015

A multi-layered methodology for defect-tolerance of datapath modules in processors.

Hsunwei Hsiung, Sandeep K. Gupta

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

2013

Interplay of Failure Rate, Performance, and Test Cost in TCAM under Process Variations.

Hsunwei Hsiung, Da Cheng, Bin Liu, Ramesh Govindan, Sandeep K. Gupta

Proceedings of the 22nd Asian Test Symposium, 2013

A New March Test for Process-Variation Induced Delay Faults in SRAMs.

Da Cheng, Hsunwei Hsiung, Bin Liu, Jianing Chen, Jia Zeng, Ramesh Govindan, Sandeep K. Gupta

Proceedings of the 22nd Asian Test Symposium, 2013

2012

Towards systematic roadmaps for networked systems.

Bin Liu, Hsunwei Hsiung, Da Cheng, Ramesh Govindan, Sandeep Gupta

Proceedings of the 11th ACM Workshop on Hot Topics in Networks, 2012

Salvaging chips with caches beyond repair.

Hsunwei Hsiung, Byeongju Cha, Sandeep K. Gupta

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012