Incheol Nam

According to our database, Incheol Nam authored at least 4 papers between 2008 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

An Offset Compensated Charge Transfer Pre-Sensing Bitline Sense Amplifier.

Kyeongtae Nam, Dongil Lee, Kyuchang Kang, Sangyun Kim, Changyoung Lee, Hyunchul Yoon, Donggeon Kim, Bokyeon Won, Jaejoon Song, Jaehyuk Kim, Incheol Nam, Young-Hun Seo, Jeong-Don Ihm, Changsik Yoo, Sangjoon Hwang

IEEE J. Solid State Circuits, April, 2025

2024

An Offset-Compensated Charge-Transfer Pre-Sensing Bit-Line Sense-Amplifier for Low-Voltage DRAM.

Kyeongtae Nam, Jaehyuk Kim, Dongil Lee, Kyuchang Kang, Sangyun Kim, Changyoung Lee, Hyunchul Yoon, Donggeon Kim, Bokyeon Won, Jaejoon Song, Incheol Nam, Young-Hun Seo, Jeong-Don Ihm, Changsik Yoo, Sangjoon Hwang

Proceedings of the IEEE Symposium on VLSI Technology and Circuits 2024, 2024

A Single-Ended Offset-Compensating Bit-Line Sense-Amplifier with Ground Precharge and Charge Transfer Pre sensing for Sub-1V DRAM.

Changyoung Lee, Youngseok Park, Hyunchul Yoon, Seryeong Yoon, Donggeon Kim, Bokyeon Won, Junhwa Song, In-Jae Bae, Jaejoon Song, Kyuchang Kang, Jaehyuk Kim, Kyungrak Cho, Incheol Nam, Jungdon Ihm, Young-Hun Seo, Changsik Yoo, Sang Jun Hwang

Proceedings of the IEEE Asian Solid-State Circuits Conference, 2024

2008

A Prevenient Voltage Stress Test Method for High Density Memory.

Jongsoo Yim, Gunbae Kim, Incheol Nam, Sangki Son, Jonghyoung Lim, Hwacheol Lee, Sangseok Kang, Byungheon Kwak, Jinseok Lee, Sungho Kang

Proceedings of the 4th IEEE International Symposium on Electronic Design, 2008