J. T. M. van Beek

According to our database, J. T. M. van Beek authored at least 3 papers in 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2008

Packaging influences on the reliability of MEMS resonators.

Jeroen J. M. Zaal, W. D. van Driel, S. Bendida, Q. Li, J. T. M. van Beek, G. Q. Zhang

Microelectron. Reliab., 2008

Failure analysis of a thin-film nitride MEMS package.

Q. Li, J. F. L. Goosen, J. T. M. van Beek, Fred van Keulen, K. L. Phan, G. Q. Zhang

Microelectron. Reliab., 2008

Temperature stability of a piezoresistive MEMS resonator including self-heating.

S. Bendida, J. J. Koning, J. J. M. Bontemps, J. T. M. van Beek, D. Wu, Marcel A. J. van Gils, S. Nath

Microelectron. Reliab., 2008