Fred van Keulen

According to our database, Fred van Keulen authored at least 11 papers between 2006 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2023

Classification and analysis of common simplifications in part-scale thermal modelling of metal additive manufacturing processes.

Rajit Ranjan, Matthijs Langelaar, Fred van Keulen, Can Ayas

Adv. Model. Simul. Eng. Sci., December, 2023

2022

Fabrication Sequence Optimization for Minimizing Distortion in Multi-Axis Additive Manufacturing.

Weiming Wang, Fred van Keulen, Jun Wu

CoRR, 2022

2021

A simple and versatile topology optimization formulation for flexure synthesis.

Stijn Koppen, Matthijs Langelaar, Fred van Keulen

CoRR, 2021

Efficient multi-partition topology optimization.

Stijn Koppen, Matthijs Langelaar, Fred van Keulen

CoRR, 2021

2020

An Interface-enriched Generalized Finite Element Method for Levelset-based Topology Optimization.

Sanne J. van den Boom, Jian Zhang, Fred van Keulen, Alejandro M. Aragón

CoRR, 2020

2018

Design and analysis adaptivity in multi-resolution topology optimization.

Deepak K. Gupta, Fred van Keulen, Matthijs Langelaar

CoRR, 2018

2014

Efficient Kriging-based robust optimization of unconstrained problems.

Samee ur Rehman, Matthijs Langelaar, Fred van Keulen

J. Comput. Sci., 2014

2009

Effect of rotator cuff dysfunction on the initial mechanical stability of cementless glenoid components.

Daniel R. Suárez, Edward R. Valstar, Jacqueline C. van der Linden, Fred van Keulen, Piet M. Rozing

Medical Biol. Eng. Comput., 2009

Surface contamination-induced resonance frequency shift of cantilevers.

Hamed Sadeghian, Chung Kai Yang, Khashayar Babaei Gavan, Hans Goosen, Emile W. J. M. van der Drift, Here van der Zant, Paddy J. French, Andre Bossche, Fred van Keulen

Proceedings of the 4th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, 2009

2008

Failure analysis of a thin-film nitride MEMS package.

Q. Li, J. F. L. Goosen, J. T. M. van Beek, Fred van Keulen, K. L. Phan, G. Q. Zhang

Microelectron. Reliab., 2008

2006

Delamination analysis of Cu/low-k technology subjected to chemical-mechanical polishing process conditions.

Cadmus A. Yuan, Willem D. van Driel, Richard B. R. van Silfhout, Olaf van der Sluis, Roy A. B. Engelen, Leo J. Ernst, Fred van Keulen, G. Q. Zhang

Microelectron. Reliab., 2006