Jan Vobecký

According to our database, Jan Vobecký authored at least 12 papers between 2003 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

TCAD study of DLC coatings for large-area high-power diodes.

Susanna Reggiani, Luigi Balestra, Antonio Gnudi, Elena Gnani, Giorgio Baccarani, J. Dobrzynska, J. Vobecký, C. Tosi

Microelectron. Reliab., 2018

2015

Programmable mask design for Phase Controlled Thyristors with automated short positioning.

Marco Bellini, Jan Vobecký

Proceedings of the IECON 2015, 2015

2014

Parameters influencing the maximum controllable current in gate commutated thyristors.

Neophytos Lophitis, Marina Antoniou, Florin Udrea, Iulian Nistor, Martin Arnold, Tobias Wikström, Jan Vobecký

IET Circuits Devices Syst., 2014

2013

High-power silicon P-i-N diode with cathode shorts: The impact of electron irradiation.

Libor Pína, Jan Vobecký

Microelectron. Reliab., 2013

2011

Molybdenum and low-temperature annealing of a silicon power P-i-N diode.

J. Vobecký, V. Komarnitskyy, V. Záhlava

Microelectron. Reliab., 2011

2010

Doping compensation for increased robustness of fast recovery silicon diodes.

J. Vobecký, V. Záhlava, V. Komarnitskyy

Microelectron. Reliab., 2010

2008

Dynamic avalanche in diodes with local lifetime control by means of palladium.

J. Vobecký, Pavel Hazdra

Microelectron. J., 2008

2006

The properties of aluminum, platinum silicide and copper based contacts for silicon high-power devices.

J. Vobecký, D. Kolesnikov

Microelectron. J., 2006

2005

Reliability of Contacts for Press-Pack High-Power Devices.

J. Vobecký, D. Kolesnikov

Microelectron. Reliab., 2005

2004

Axial lifetime control in silicon power diodes by irradiation with protons, alphas, low- and high-energy electrons.

Pavel Hazdra, Jan Vobecký, H. Dorschner, K. Brand

Microelectron. J., 2004

2003

Impact of the electron, proton and helium irradiation on the forward I-V characteristics of high-power P-i-N diode.

J. Vobecký, Pavel Hazdra, V. Záhlava

Microelectron. Reliab., 2003

Advanced Local Lifetime Control for Higher Reliability of Power Devices.

J. Vobecký, Pavel Hazdra

Microelectron. Reliab., 2003