Jayant D'Souza

According to our database, Jayant D'Souza authored at least 4 papers between 2008 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Advanced fault model, diagnosis and applications for deep nanometer process.

Youngseok Son, Muyun Cho, Hyunyul Lim, Jaeseok Park, Piotr Zimnowlodzki, Szczepan Urban, Jayant D'Souza, Manish Sharma

Proceedings of the IEEE International Test Conference, 2025

Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon Defects.

Wu-Tung Cheng, Manish Sharma, Artur Stelmach, Jakub Janicki, Preston McWithey, Gaurav Veda, Szczepan Urban, Jayant D'Souza

Proceedings of the IEEE International Test Conference, 2025

2023

Predicting the Resolution of Scan Diagnosis.

Manoj Devendhiran, Jakub Janicki, Szczepan Urban, Manish Sharma, Jayant D'Souza

Proceedings of the IEEE International Test Conference, 2023

2008

High Test Quality in Low Pin Count Applications.

Jayant D'Souza, Subramanian Mahadevan, Nilanjan Mukherjee, Graham Rhodes, Jocelyn Moreau, Thomas Droniou, Paul Armagnat, Damien Sartoretti

Proceedings of the 2008 IEEE International Test Conference, 2008