Paul Armagnat

According to our database1, Paul Armagnat
  • authored at least 3 papers between 2008 and 2017.
  • has a "Dijkstra number"2 of six.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Other 

Links

On csauthors.net:

Bibliography

2017
Effective scan chain failure analysis method.
Microelectronics Reliability, 2017

2009
Running scan test on three pins: yes we can!
Proceedings of the 2009 IEEE International Test Conference, 2009

2008
High Test Quality in Low Pin Count Applications.
Proceedings of the 2008 IEEE International Test Conference, 2008


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