According to our database1, Paul Armagnat authored at least 3 papers between 2008 and 2017.
Legend:Book In proceedings Article PhD thesis Other
Effective scan chain failure analysis method.
Microelectronics Reliability, 2017
Running scan test on three pins: yes we can!
Proceedings of the 2009 IEEE International Test Conference, 2009
High Test Quality in Low Pin Count Applications.
Proceedings of the 2008 IEEE International Test Conference, 2008