Subramanian Mahadevan

According to our database, Subramanian Mahadevan authored at least 4 papers between 2005 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

In-Field Testing using In-System Embedded Deterministic Test as a solution to alleviate Silent Data Corruption in AI designs.

Varun Sehgal, Subramanian Mahadevan, Ashrith S. Harith, Mohit Sharma, Saket Goyal, Nilanjan Mukherjee

Proceedings of the IEEE International Test Conference, 2025

2024

Deterministic In-Fleet Scan Test for a Cloud Computing Platform.

Dan Trock, Subramanian Mahadevan, Nilanjan Mukherjee, Lee Harrison, Janusz Rajski, Jerzy Tyszer

Proceedings of the IEEE International Test Conference, 2024

2008

High Test Quality in Low Pin Count Applications.

Jayant D'Souza, Subramanian Mahadevan, Nilanjan Mukherjee, Graham Rhodes, Jocelyn Moreau, Thomas Droniou, Paul Armagnat, Damien Sartoretti

Proceedings of the 2008 IEEE International Test Conference, 2008

2005

Achieving High Test Quality with Reduced Pin Count Testing.

Jay Jahangiri, Nilanjan Mukherjee, Wu-Tung Cheng, Subramanian Mahadevan, Ron Press

Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005