Szczepan Urban

According to our database, Szczepan Urban authored at least 11 papers between 2019 and 2025.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2025

Chain Cell-Aware Diagnosis.

Szczepan Urban, Jakub Janicki, Piotr Zimnowlodzki, Artur Stelmach, Manish Sharma

Proceedings of the IEEE International Test Conference, 2025

Advanced fault model, diagnosis and applications for deep nanometer process.

Youngseok Son, Muyun Cho, Hyunyul Lim, Jaeseok Park, Piotr Zimnowlodzki, Szczepan Urban, Jayant D'Souza, Manish Sharma

Proceedings of the IEEE International Test Conference, 2025

Using Distinguishing Bits to Improve Chain Diagnosis Coverage for Silicon Defects.

Wu-Tung Cheng, Manish Sharma, Artur Stelmach, Jakub Janicki, Preston McWithey, Gaurav Veda, Szczepan Urban, Jayant D'Souza

Proceedings of the IEEE International Test Conference, 2025

Improving Effect-Cause Diagnosis Performance with Minimal Memory Overhead on Asymmetric Partition Trees (APT).

Wu-Tung Cheng, Szczepan Urban, Manish Sharma, Jakub Janicki

Proceedings of the IEEE International Test Conference in Asia, 2025

2024

Adaptive Diagnosis Points for 100% Chain Diagnosis Coverage.

Wu-Tung Cheng, Manish Sharma, Xin Yang, Artur Stelmach, Szczepan Urban, Jakub Janicki, Preston McWithey

Proceedings of the IEEE International Test Conference, 2024

2023

Global Control Signal Defect Diagnosis in Volume Production Environment.

Szczepan Urban, Piotr Zimnowlodzki, Manish Sharma, Shraddha Bodhe, John Schulze, Abdullah Yassine, Adam Styblinski

Proceedings of the IEEE International Test Conference, 2023

Predicting the Resolution of Scan Diagnosis.

Manoj Devendhiran, Jakub Janicki, Szczepan Urban, Manish Sharma, Jayant D'Souza

Proceedings of the IEEE International Test Conference, 2023

2022

Industry Evaluation of Reversible Scan Chain Diagnosis.

Soumya Mittal, Szczepan Urban, Kun Young Chung, Jakub Janicki, Wu-Tung Cheng, Martin Parley, Manish Sharma, Shaun Nicholson

Proceedings of the IEEE International Test Conference, 2022

2020

Scan Chain Diagnosis-Driven Test Response Compactor.

Jakub Janicki, Grzegorz Mrugalski, Artur Stelmach, Szczepan Urban

Proceedings of the 29th IEEE Asian Test Symposium, 2020

2019

Reversible Scan Based Diagnostic Patterns.

Yu Huang, Szczepan Urban, Wu-Tung Cheng, Manish Sharma, Fengju Niu, Junna Zhong, Wen-Lung Hsu

Proceedings of the International Symposium on VLSI Design, Automation and Test, 2019

Non-Adaptive Pattern Reordering to Improve Scan Chain Diagnostic Resolution.

Yu Huang, Jakub Janicki, Szczepan Urban

Proceedings of the 24th IEEE European Test Symposium, 2019