Jeff P. Gambino

According to our database, Jeff P. Gambino authored at least 4 papers between 2018 and 2021.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2021

Assessing SiCr resistor drift for automotive analog ICs.

Kevin A. Stewart, Keiichi Kimura, Matt Ring, Koen Noldus, Pat Hulse, Rick C. Jerome, Akihiro Hasegawa, Jeff P. Gambino, David T. Price

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Dielectric Relaxation, Aging and Recovery in High-K MIM Capacitors.

Konner E. K. Holden, Gavin D. R. Hall, Michael Cook, Chris Kendrick, Kaitlyn Pabst, Bruce Greenwood, Robin Daugherty, Jeff P. Gambino, Derryl D. J. Allman

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Effect of Residual TiN on Reliability of Au Wire Bonds during High Temperature Storage.

John M. McGlone, Guy Brizar, Daniel Vanderstraeten, Dorai Iyer, Sallie Hose, Jeff P. Gambino

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Polysilicon resistor stability under voltage stress for safe-operating area characterization.

Chris Kendrick, Michael Cook, Jeff P. Gambino, T. Myers, J. Slezak, T. Hirano, T. Sano, Y. Watanabe, K. Ozeki

Proceedings of the IEEE International Reliability Physics Symposium, 2018